Research output per year
Research output per year
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Dive into the research topics where Hiroki Koike is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability
Watanabe, K., Shimada, T., Hirose, K., Shindo, H., Kobayashi, D., Tanigawa, T., Ikeda, S., Shinada, T., Koike, H., Endoh, T., Makino, T. & Ohshima, T., 2022, 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. P541-P545 (IEEE International Reliability Physics Symposium Proceedings; vol. 2022-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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40 nm 1T-1MTJ 128 Mb STT-MRAM with Novel Averaged Reference Voltage Generator Based on Detailed Analysis of Scaled-Down Memory Cell Array Design
Koike, H., Tanigawa, T., Watanabe, T., Nasuno, T., Noguchi, Y., Yasuhira, M., Yoshiduka, T., Ma, Y., Honjo, H., Nishioka, K., Miura, S., Inoue, H., Ikeda, S. & Endoh, T., 2021 Mar, In: IEEE Transactions on Magnetics. 57, 3, 9260242.Research output: Contribution to journal › Article › peer-review
3 Citations (Scopus) -
Review of STT-MRAM circuit design strategies, and a 40-nm 1T-1MTJ 128Mb STT-MRAM design practice
Koike, H., Tanigawa, T., Watanabe, T., Nasuno, T., Noguchi, Y., Yasuhira, M., Yoshiduka, T., Ma, Y., Honjo, H., Nishioka, K., Miura, S., Inoue, H., Ikeda, S. & Endoh, T., 2020 Aug 17, 2020 IEEE 31st Magnetic Recording Conference, TMRC 2020. Institute of Electrical and Electronics Engineers Inc., 9366711. (2020 IEEE 31st Magnetic Recording Conference, TMRC 2020).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Citations (Scopus) -
12.1 An FPGA-Accelerated Fully Nonvolatile Microcontroller Unit for Sensor-Node Applications in 40nm CMOS/MTJ-Hybrid Technology Achieving 47.14μW Operation at 200MHz
Natsui, M., Suzuki, D., Tamakoshi, A., Watanabe, T., Honjo, H., Koike, H., Nasuno, T., Ma, Y., Tanigawa, T., Noguchi, Y., Yasuhira, M., Sato, H., Ikeda, S., Ohno, H., Endoh, T. & Hanyu, T., 2019 Mar 6, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 202-204 3 p. 8662431. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
18 Citations (Scopus) -
14ns write speed 128Mb density Embedded STT-MRAM with endurance>10 10 and 10yrs retention@85°C using novel low damage MTJ integration process
Sato, H., Honjo, H., Watanabe, T., Niwa, M., Koike, H., Miura, S., Saito, T., Inoue, H., Nasuno, T., Tanigawa, T., Noguchi, Y., Yoshiduka, T., Yasuhira, M., Ikeda, S., Kang, S. Y., Kubo, T., Yamashita, K., Yagi, Y., Tamura, R. & Endoh, T., 2019 Jan 16, 2018 IEEE International Electron Devices Meeting, IEDM 2018. Institute of Electrical and Electronics Engineers Inc., p. 27.2.1-27.2.4 8614606. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2018-December).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
19 Citations (Scopus)
Press/Media
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US Patent Issued to TOHOKU UNIVERSITY on Aug. 16 for "Integrated circuit device" (Japanese Inventors)
22/8/17
1 item of Media coverage
Press/Media
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US Patent Issued to TOHOKU UNIVERSITY on Sept. 22 for "System, method, and non-transitory computer readable recording medium storing a program recorded thereon for supporting a design of a circuit including a stochastic operation element" (Japanese Invent
Tetsuo Endoh, Takahiro Hanyu, Masanori Natsui, Hideo Ohno & Hiroki Koike
20/9/23
1 item of Media coverage
Press/Media
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US Patent Issued to Tohoku University on May 26 for "Memory circuit provided with variable-resistance element" (Japanese Inventors)
20/5/27
1 item of Media coverage
Press/Media
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Accurate Error Bit Mode Analysis Of STT-MRAM Chip With A Novel Current Measurement Module
19/6/11
1 item of Media coverage
Press/Media