(1101) twin dislocation structures in evaporated titanium thin films

L. A. Bursill, Ju Lin Peng, Xu Dong Fan, Y. Kasukabe, Y. Yamada

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)


High-resolution transmission electron micrographs of (1101) interfacial twin dislocations in Ti thin films, previously published in this journal, are re-examined. Computer simulations of the experimental images have been obtained using atomic models deduced by Pond, Bacon and Serra in 1995. Two twin dislocations were analysed, with step heights of 4d(K1) and 2d(K1), where d(K1) is the spacing of the (1101) planes. Reasonable agreement with the predicted structures is obtained at about 0.17nm resolution.

Original languageEnglish
Pages (from-to)269-273
Number of pages5
JournalPhilosophical Magazine Letters
Issue number5
Publication statusPublished - 1995 May 1


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