190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor

Yasuyuki Fujihara; Satoshi Nasuno; Shunichi Wakashima; Yusuke Aoyagi; Rihito Kuroda; Shigetoshi Sugawa

doi:10.1109/ICSENS.2016.7808492

190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor

Yasuyuki Fujihara, Satoshi Nasuno, Shunichi Wakashima, Yusuke Aoyagi, Rihito Kuroda, Shigetoshi Sugawa

New Industry Creation Hatchery Center (NICHe)

Tohoku University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Citations (Scopus)

Abstract

A 190-1100nm waveband multispectral imaging system is presented utilizing a high light resistance, wide dynamic range CMOS image sensor. The specially developed prototype image sensor exhibited 190-1100nm spectral sensitivity, 94dB wide dynamic range with 87ke^- full well capacity and 1200fps frame rate, and no degradation of light sensitivity and dark current was observed after strong UV-light irradiation stress. With the developed system, real-time multispectral imaging using UV-Visible-Near IR light waveband was successfully conducted.

Original language	English
Title of host publication	IEEE Sensors, SENSORS 2016 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479982875
DOIs	https://doi.org/10.1109/ICSENS.2016.7808492
Publication status	Published - 2016 Jan 5
Event	15th IEEE Sensors Conference, SENSORS 2016 - Orlando, United States Duration: 2016 Oct 30 → 2016 Nov 2

Publication series

Name	Proceedings of IEEE Sensors
Volume	0
ISSN (Print)	1930-0395
ISSN (Electronic)	2168-9229

Conference

Conference	15th IEEE Sensors Conference, SENSORS 2016
Country/Territory	United States
City	Orlando
Period	16/10/30 → 16/11/2

Keywords

CMOS image sensor
Spectral imaging
UV-Visible-Near IR light waveband

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10.1109/ICSENS.2016.7808492

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Fujihara, Y., Nasuno, S., Wakashima, S., Aoyagi, Y., Kuroda, R., & Sugawa, S. (2016). 190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor. In IEEE Sensors, SENSORS 2016 - Proceedings Article 7808492 (Proceedings of IEEE Sensors; Vol. 0). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSENS.2016.7808492

@inproceedings{adfe4ca21c754af4aea1b1f53cb7f060,

title = "190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor",

abstract = "A 190-1100nm waveband multispectral imaging system is presented utilizing a high light resistance, wide dynamic range CMOS image sensor. The specially developed prototype image sensor exhibited 190-1100nm spectral sensitivity, 94dB wide dynamic range with 87ke- full well capacity and 1200fps frame rate, and no degradation of light sensitivity and dark current was observed after strong UV-light irradiation stress. With the developed system, real-time multispectral imaging using UV-Visible-Near IR light waveband was successfully conducted.",

keywords = "CMOS image sensor, Spectral imaging, UV-Visible-Near IR light waveband",

author = "Yasuyuki Fujihara and Satoshi Nasuno and Shunichi Wakashima and Yusuke Aoyagi and Rihito Kuroda and Shigetoshi Sugawa",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 15th IEEE Sensors Conference, SENSORS 2016 ; Conference date: 30-10-2016 Through 02-11-2016",

year = "2016",

month = jan,

day = "5",

doi = "10.1109/ICSENS.2016.7808492",

language = "English",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Fujihara, Y, Nasuno, S, Wakashima, S, Aoyagi, Y, Kuroda, R & Sugawa, S 2016, 190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor. in IEEE Sensors, SENSORS 2016 - Proceedings., 7808492, Proceedings of IEEE Sensors, vol. 0, Institute of Electrical and Electronics Engineers Inc., 15th IEEE Sensors Conference, SENSORS 2016, Orlando, United States, 16/10/30. https://doi.org/10.1109/ICSENS.2016.7808492

190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor. / Fujihara, Yasuyuki; Nasuno, Satoshi; Wakashima, Shunichi et al.
IEEE Sensors, SENSORS 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. 7808492 (Proceedings of IEEE Sensors; Vol. 0).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Fujihara, Yasuyuki

AU - Nasuno, Satoshi

AU - Wakashima, Shunichi

AU - Aoyagi, Yusuke

AU - Kuroda, Rihito

AU - Sugawa, Shigetoshi

PY - 2016/1/5

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N2 - A 190-1100nm waveband multispectral imaging system is presented utilizing a high light resistance, wide dynamic range CMOS image sensor. The specially developed prototype image sensor exhibited 190-1100nm spectral sensitivity, 94dB wide dynamic range with 87ke- full well capacity and 1200fps frame rate, and no degradation of light sensitivity and dark current was observed after strong UV-light irradiation stress. With the developed system, real-time multispectral imaging using UV-Visible-Near IR light waveband was successfully conducted.

AB - A 190-1100nm waveband multispectral imaging system is presented utilizing a high light resistance, wide dynamic range CMOS image sensor. The specially developed prototype image sensor exhibited 190-1100nm spectral sensitivity, 94dB wide dynamic range with 87ke- full well capacity and 1200fps frame rate, and no degradation of light sensitivity and dark current was observed after strong UV-light irradiation stress. With the developed system, real-time multispectral imaging using UV-Visible-Near IR light waveband was successfully conducted.

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KW - Spectral imaging

KW - UV-Visible-Near IR light waveband

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M3 - Conference contribution

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BT - IEEE Sensors, SENSORS 2016 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 15th IEEE Sensors Conference, SENSORS 2016

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190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor

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