Abstract
Three-dimentional structure of poly(styrene-block-isoprene) (SI) diblock copolymer thin films was studied by means of transmission electron microtomography (TEMT). After annealing at 120°C, it was found that the SI thin film spin-coated on silicon wafer exhibited Hexagonally Perforated Layer (HPL) morphology with its lamellae highly oriented parallel to the substrate. The stacking sequences of HPL channels can be modeled as both AB-stacking and ABC-stacking patterns, as illustrated in Fig. 1. As a result of three-dimensional observation, we found that this sample formed ABC-stacking.
Original language | English |
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Pages | 927 |
Number of pages | 1 |
Publication status | Published - 2006 |
Event | 55th SPSJ Annual Meeting - Nagoya, Japan Duration: 2006 May 24 → 2006 May 26 |
Conference
Conference | 55th SPSJ Annual Meeting |
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Country/Territory | Japan |
City | Nagoya |
Period | 06/5/24 → 06/5/26 |
Keywords
- Block copolymer
- Hexagonally Perforated Layer
- Thin films
- Transmission Electron Microtomography