TY - GEN
T1 - A 500-MHz MRAM macro for high-performance SoCs
AU - Sakimura, Noboru
AU - Nebashi, Ryusuke
AU - Honjo, Hiroaki
AU - Saito, Shinsaku
AU - Kato, Yuko
AU - Sugibayashi, Tadahiko
PY - 2008
Y1 - 2008
N2 - A 500-MHz MRAM macro is developed using a 0.15-μm CMOS process and a newly developed MRAM process. The macro is designed using a 20.17-μm 2 5-transistor 2-magnetic tunnel junction (5T2MTJ) cell that has individual ports for writing and reading. An access time of less than 2 ns was obtained by employing a hierarchically-divided read bit line (RBL) and a high pre-charge sensing scheme. The operation speed is the highest among MRAMs that have been reported. This MRAM macro can coexist with the more area-effective 2TlMTJ-cell-based MRAM macro in SoCs.
AB - A 500-MHz MRAM macro is developed using a 0.15-μm CMOS process and a newly developed MRAM process. The macro is designed using a 20.17-μm 2 5-transistor 2-magnetic tunnel junction (5T2MTJ) cell that has individual ports for writing and reading. An access time of less than 2 ns was obtained by employing a hierarchically-divided read bit line (RBL) and a high pre-charge sensing scheme. The operation speed is the highest among MRAMs that have been reported. This MRAM macro can coexist with the more area-effective 2TlMTJ-cell-based MRAM macro in SoCs.
UR - http://www.scopus.com/inward/record.url?scp=67649980229&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=67649980229&partnerID=8YFLogxK
U2 - 10.1109/ASSCC.2008.4708778
DO - 10.1109/ASSCC.2008.4708778
M3 - Conference contribution
AN - SCOPUS:67649980229
SN - 9781424426058
T3 - Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
SP - 261
EP - 264
BT - Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
T2 - 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
Y2 - 3 November 2008 through 5 November 2008
ER -