A Comparative Study of the Growth of Cr on (110)TiO2 Rutile, (0001) α-Al2O3 and (100)SrTiO3 Surfaces

T. Wagner; Q. Fu; C. Winde; S. Tsukimoto; F. Phillipp

doi:10.1023/B:INTS.0000012303.59127.37

A Comparative Study of the Growth of Cr on (110)TiO₂ Rutile, (0001) α-Al₂O₃ and (100)SrTiO₃ Surfaces

T. Wagner, Q. Fu, C. Winde, S. Tsukimoto, F. Phillipp

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Thin Cr films were deposited on single crystal α-Al₂O ₃, SrTiO₃ and TiO₂ (rutile) substrates under ultrahigh vacuum conditions using molecular beam epitaxy (MBE). The growth behavior and thermal stability of the films were investigated with scanning tunneling microscopy (STM), X-ray phototelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and transmission electron microscopy (TEM). Cr grew as 3D clusters on all substrates. For all three Cr/oxide systems a strong temperature dependent interfacial reaction was observed. The results suggested that these reactions depended greatly on thermodynamics and on transport properties in the oxide substrates.

Original language	English
Pages (from-to)	117-126
Number of pages	10
Journal	Interface Science
Volume	12
Issue number	1
DOIs	https://doi.org/10.1023/B:INTS.0000012303.59127.37
Publication status	Published - 2004 Jan

Keywords

AES
Cr
MBE
Metal-oxide interfaces
STM
TEM
XPS

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Materials Science(all)
Condensed Matter Physics

Access to Document

10.1023/B:INTS.0000012303.59127.37

Cite this

@article{7fab142328a24dc8a0b1896d941676c1,

title = "A Comparative Study of the Growth of Cr on (110)TiO2 Rutile, (0001) α-Al2O3 and (100)SrTiO3 Surfaces",

abstract = "Thin Cr films were deposited on single crystal α-Al2O 3, SrTiO3 and TiO2 (rutile) substrates under ultrahigh vacuum conditions using molecular beam epitaxy (MBE). The growth behavior and thermal stability of the films were investigated with scanning tunneling microscopy (STM), X-ray phototelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and transmission electron microscopy (TEM). Cr grew as 3D clusters on all substrates. For all three Cr/oxide systems a strong temperature dependent interfacial reaction was observed. The results suggested that these reactions depended greatly on thermodynamics and on transport properties in the oxide substrates.",

keywords = "AES, Cr, MBE, Metal-oxide interfaces, STM, TEM, XPS",

author = "T. Wagner and Q. Fu and C. Winde and S. Tsukimoto and F. Phillipp",

year = "2004",

month = jan,

doi = "10.1023/B:INTS.0000012303.59127.37",

language = "English",

volume = "12",

pages = "117--126",

journal = "Journal of Materials Science",

issn = "0022-2461",

publisher = "Springer Netherlands",

number = "1",

}

TY - JOUR

T1 - A Comparative Study of the Growth of Cr on (110)TiO2 Rutile, (0001) α-Al2O3 and (100)SrTiO3 Surfaces

AU - Wagner, T.

AU - Fu, Q.

AU - Winde, C.

AU - Tsukimoto, S.

AU - Phillipp, F.

PY - 2004/1

Y1 - 2004/1

N2 - Thin Cr films were deposited on single crystal α-Al2O 3, SrTiO3 and TiO2 (rutile) substrates under ultrahigh vacuum conditions using molecular beam epitaxy (MBE). The growth behavior and thermal stability of the films were investigated with scanning tunneling microscopy (STM), X-ray phototelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and transmission electron microscopy (TEM). Cr grew as 3D clusters on all substrates. For all three Cr/oxide systems a strong temperature dependent interfacial reaction was observed. The results suggested that these reactions depended greatly on thermodynamics and on transport properties in the oxide substrates.

AB - Thin Cr films were deposited on single crystal α-Al2O 3, SrTiO3 and TiO2 (rutile) substrates under ultrahigh vacuum conditions using molecular beam epitaxy (MBE). The growth behavior and thermal stability of the films were investigated with scanning tunneling microscopy (STM), X-ray phototelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and transmission electron microscopy (TEM). Cr grew as 3D clusters on all substrates. For all three Cr/oxide systems a strong temperature dependent interfacial reaction was observed. The results suggested that these reactions depended greatly on thermodynamics and on transport properties in the oxide substrates.

KW - AES

KW - Cr

KW - MBE

KW - Metal-oxide interfaces

KW - STM

KW - TEM

KW - XPS

UR - http://www.scopus.com/inward/record.url?scp=1042265971&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1042265971&partnerID=8YFLogxK

U2 - 10.1023/B:INTS.0000012303.59127.37

DO - 10.1023/B:INTS.0000012303.59127.37

M3 - Article

AN - SCOPUS:1042265971

SN - 0022-2461

VL - 12

SP - 117

EP - 126

JO - Journal of Materials Science

JF - Journal of Materials Science

IS - 1

ER -