A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons

M. Terauchi

doi:10.1017/S1431927604883880

A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons

M. Terauchi

IMRAM - Division of Measurements

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	1044-1045
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604883880
Publication status	Published - 2004

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10.1017/S1431927604883880

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@article{22817074cc034bbabca2aca03d01b777,

title = "A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons",

author = "M. Terauchi",

year = "2004",

doi = "10.1017/S1431927604883880",

language = "English",

volume = "10",

pages = "1044--1045",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons

AU - Terauchi, M.

PY - 2004

Y1 - 2004

UR - http://www.scopus.com/inward/record.url?scp=4544352182&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4544352182&partnerID=8YFLogxK

U2 - 10.1017/S1431927604883880

DO - 10.1017/S1431927604883880

M3 - Article

AN - SCOPUS:4544352182

SN - 1431-9276

VL - 10

SP - 1044

EP - 1045

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons

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