A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability

K. Horiba; H. Ohguchi; H. Kumigashira; M. Oshima; K. Ono; N. Nakagawa; M. Lippmaa; M. Kawasaki; H. Koinuma

doi:10.1063/1.1584093

A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability

K. Horiba, H. Ohguchi, H. Kumigashira, M. Oshima, K. Ono, N. Nakagawa, M. Lippmaa, M. Kawasaki, H. Koinuma

Research output: Contribution to journal › Article › peer-review

104 Citations (Scopus)

Abstract

A study was performed on a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer with in situ oxide thin film growth capability. It was used to investigate the electronic structure of transition metal oxide thin films. It was found that a momentum resolution of 0.02 Å^-1 (0.2°) and a total energy resolution of 6.3 meV were obtained at a photon energy of 40 eV.

Original language	English
Pages (from-to)	3406-3412
Number of pages	7
Journal	Review of Scientific Instruments
Volume	74
Issue number	7
DOIs	https://doi.org/10.1063/1.1584093
Publication status	Published - 2003 Jul
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1584093

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title = "A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability",

abstract = "A study was performed on a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer with in situ oxide thin film growth capability. It was used to investigate the electronic structure of transition metal oxide thin films. It was found that a momentum resolution of 0.02 {\AA}-1 (0.2°) and a total energy resolution of 6.3 meV were obtained at a photon energy of 40 eV.",

author = "K. Horiba and H. Ohguchi and H. Kumigashira and M. Oshima and K. Ono and N. Nakagawa and M. Lippmaa and M. Kawasaki and H. Koinuma",

year = "2003",

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volume = "74",

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T1 - A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability

AU - Horiba, K.

AU - Ohguchi, H.

AU - Kumigashira, H.

AU - Oshima, M.

AU - Ono, K.

AU - Nakagawa, N.

AU - Lippmaa, M.

AU - Kawasaki, M.

AU - Koinuma, H.

PY - 2003/7

Y1 - 2003/7

N2 - A study was performed on a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer with in situ oxide thin film growth capability. It was used to investigate the electronic structure of transition metal oxide thin films. It was found that a momentum resolution of 0.02 Å-1 (0.2°) and a total energy resolution of 6.3 meV were obtained at a photon energy of 40 eV.

AB - A study was performed on a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer with in situ oxide thin film growth capability. It was used to investigate the electronic structure of transition metal oxide thin films. It was found that a momentum resolution of 0.02 Å-1 (0.2°) and a total energy resolution of 6.3 meV were obtained at a photon energy of 40 eV.

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U2 - 10.1063/1.1584093

DO - 10.1063/1.1584093

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JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 7

ER -

A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability

Abstract

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