Abstract
A new 200kV Ω-filter electron microscope was developed under a project supported by a Grant-in-Aid for Specially Promoted Research of the Ministry of Education. Science, Sports and Culture of Japan. The performance of the microscope is described.
Original language | English |
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Pages (from-to) | 219-227 |
Number of pages | 9 |
Journal | Journal of Microscopy |
Volume | 194 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1999 |
Keywords
- CBED
- Electron microscope
- Omega filter
- Structure refinement