A new apparatus for in situ photoluminescence spectroscopy in a transmission electron microscope

Y. Ohno; S. Takeda

doi:10.1063/1.1146166

A new apparatus for in situ photoluminescence spectroscopy in a transmission electron microscope

Y. Ohno, S. Takeda

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

We have developed an in situ TEM/PL apparatus, which enables us to excite PL emissions from a microscopic area of a specimen inside a TEM. The microscopical area of 20 μm can be examined by TEM, PL, and CL methods under the same experimental conditions. The apparatus may be applied to a transmission electron microscope of side-entry type with a minor modification. The apparatus is extremely useful for microscopic characterization of structural and electronic properties in an inhomogeneous material. Utilizing the apparatus, we have examined the spatial distribution of extended defects and point-defect complexes in CVD diamond. The apparatus will be utilized to study the structural and optical properties of materials under electron irradiation.

Original language	English
Pages (from-to)	4866-4869
Number of pages	4
Journal	Review of Scientific Instruments
Volume	66
Issue number	10
DOIs	https://doi.org/10.1063/1.1146166
Publication status	Published - 1995
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1146166

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title = "A new apparatus for in situ photoluminescence spectroscopy in a transmission electron microscope",

abstract = "We have developed an in situ TEM/PL apparatus, which enables us to excite PL emissions from a microscopic area of a specimen inside a TEM. The microscopical area of 20 μm can be examined by TEM, PL, and CL methods under the same experimental conditions. The apparatus may be applied to a transmission electron microscope of side-entry type with a minor modification. The apparatus is extremely useful for microscopic characterization of structural and electronic properties in an inhomogeneous material. Utilizing the apparatus, we have examined the spatial distribution of extended defects and point-defect complexes in CVD diamond. The apparatus will be utilized to study the structural and optical properties of materials under electron irradiation.",

author = "Y. Ohno and S. Takeda",

year = "1995",

doi = "10.1063/1.1146166",

language = "English",

volume = "66",

pages = "4866--4869",

journal = "Review of Scientific Instruments",

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publisher = "American Institute of Physics Publising LLC",

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T1 - A new apparatus for in situ photoluminescence spectroscopy in a transmission electron microscope

AU - Ohno, Y.

AU - Takeda, S.

PY - 1995

Y1 - 1995

N2 - We have developed an in situ TEM/PL apparatus, which enables us to excite PL emissions from a microscopic area of a specimen inside a TEM. The microscopical area of 20 μm can be examined by TEM, PL, and CL methods under the same experimental conditions. The apparatus may be applied to a transmission electron microscope of side-entry type with a minor modification. The apparatus is extremely useful for microscopic characterization of structural and electronic properties in an inhomogeneous material. Utilizing the apparatus, we have examined the spatial distribution of extended defects and point-defect complexes in CVD diamond. The apparatus will be utilized to study the structural and optical properties of materials under electron irradiation.

AB - We have developed an in situ TEM/PL apparatus, which enables us to excite PL emissions from a microscopic area of a specimen inside a TEM. The microscopical area of 20 μm can be examined by TEM, PL, and CL methods under the same experimental conditions. The apparatus may be applied to a transmission electron microscope of side-entry type with a minor modification. The apparatus is extremely useful for microscopic characterization of structural and electronic properties in an inhomogeneous material. Utilizing the apparatus, we have examined the spatial distribution of extended defects and point-defect complexes in CVD diamond. The apparatus will be utilized to study the structural and optical properties of materials under electron irradiation.

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DO - 10.1063/1.1146166

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SN - 0034-6748

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EP - 4869

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 10

ER -

A new apparatus for in situ photoluminescence spectroscopy in a transmission electron microscope

Abstract

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