A new method for measuring the three viscosities of an N-type LC using VA mode cells

T. Kishimoto; T. Miyashita; Y. Kuratomi; H. Yaginuma; T. Ishinabe; T. Uchida

A new method for measuring the three viscosities of an N-type LC using VA mode cells

T. Kishimoto, T. Miyashita, Y. Kuratomi, H. Yaginuma, T. Ishinabe, T. Uchida

ENG - Electronic Engineering

Research output: Contribution to conference › Paper › peer-review

2 Citations (Scopus)

Abstract

We have already developed a novel method for measuring the three viscosities of p-type nematic liquid crystals using a separate fitting procedure (MVS-method). In another paper given at this conference, we proposed a method that can be applied to n-type liquid crystals, in which an initial bias voltage is applied In this paper, we confirmed the validity of our method experimentally.

Original language	English
Pages	45-48
Number of pages	4
Publication status	Published - 2005
Event	IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 - Takamatsu, Japan Duration: 2005 Dec 6 → 2005 Dec 9

Conference

Conference	IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005
Country/Territory	Japan
City	Takamatsu
Period	05/12/6 → 05/12/9

Cite this

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title = "A new method for measuring the three viscosities of an N-type LC using VA mode cells",

abstract = "We have already developed a novel method for measuring the three viscosities of p-type nematic liquid crystals using a separate fitting procedure (MVS-method). In another paper given at this conference, we proposed a method that can be applied to n-type liquid crystals, in which an initial bias voltage is applied In this paper, we confirmed the validity of our method experimentally.",

author = "T. Kishimoto and T. Miyashita and Y. Kuratomi and H. Yaginuma and T. Ishinabe and T. Uchida",

year = "2005",

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note = "IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 ; Conference date: 06-12-2005 Through 09-12-2005",

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TY - CONF

T1 - A new method for measuring the three viscosities of an N-type LC using VA mode cells

AU - Kishimoto, T.

AU - Miyashita, T.

AU - Kuratomi, Y.

AU - Yaginuma, H.

AU - Ishinabe, T.

AU - Uchida, T.

PY - 2005

Y1 - 2005

N2 - We have already developed a novel method for measuring the three viscosities of p-type nematic liquid crystals using a separate fitting procedure (MVS-method). In another paper given at this conference, we proposed a method that can be applied to n-type liquid crystals, in which an initial bias voltage is applied In this paper, we confirmed the validity of our method experimentally.

AB - We have already developed a novel method for measuring the three viscosities of p-type nematic liquid crystals using a separate fitting procedure (MVS-method). In another paper given at this conference, we proposed a method that can be applied to n-type liquid crystals, in which an initial bias voltage is applied In this paper, we confirmed the validity of our method experimentally.

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UR - http://www.scopus.com/inward/citedby.url?scp=33644585168&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:33644585168

SP - 45

EP - 48

T2 - IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005

Y2 - 6 December 2005 through 9 December 2005

ER -

A new method for measuring the three viscosities of an N-type LC using VA mode cells

Abstract

Conference

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