A novel frequency-band-selecting pulsed eddy current testing method for the detection of a certain depth range of defects

Peng Li, Shejuan Xie, Kedian Wang, Ying Zhao, Lei Zhang, Zhenmao Chen, Tetsuya Uchimoto, Toshiyuki Takagi

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

Local wall thinning is one of the major defects in industrial structures and in some cases it generates in a certain depth range of the object structures. In this study, a novel nondestructive testing method called frequency-band-selecting pulsed eddy current testing (FSPECT) is proposed to detect a certain depth range of defects. This novel FSPECT method is based on the frequency-band-selecting strategy as well as the conventional square wave pulsed eddy current testing (PECT) method. In this study, FSPECT method is introduced and the frequency range selection principle of the excitation signal of FSPECT is explained in details at first. Then the simulation of FSPECT for detecting a certain depth range of defects has been performed. In addition, the sensitivities of the proposed FSPECT and the conventional PECT are compared and analyzed. Finally, a comparative experiment of FSPECT method and PECT method is implemented. The superiority of the proposed FSPECT method for detecting a certain depth range of defects is demonstrated through simulation and experiment.

Original languageEnglish
Article number102154
JournalNDT and E International
Volume107
DOIs
Publication statusPublished - 2019 Oct

Keywords

  • Detection sensitivity comparison
  • Experiment
  • Frequency-band-selecting PECT
  • PECT
  • Simulation

Fingerprint

Dive into the research topics of 'A novel frequency-band-selecting pulsed eddy current testing method for the detection of a certain depth range of defects'. Together they form a unique fingerprint.

Cite this