@inproceedings{c1129a818a2d4d37a2fa7baf021e466d,
title = "A practical evaluation method for em information leakage by using audible signal",
abstract = "A method for evaluating electromagnetic (EM) information leakage through EM emanation from displays is introduced. The basic idea is that the method determines the information leakage by detecting an audio signal without reconstructing the screen image. We propose an image which is called the controlled image. When the controlled image is displayed on a device, an audible frequency range signal is generated at information leakage frequency. By detecting the audio signal, we can confirm the information leakage. Several leakage frequencies of a laptop PC are obtained by the proposed method and we were able to reconstruct the screen image of the laptop at the frequencies we obtained to confirm the validity of our method.",
keywords = "Electromagnetic (EM) information leakage, EM emanarion, LCD display, Leakage evaluation",
author = "Ryota Birukawa and Takaaki Mizuki and Hideaki Sone and Hayashi, {Yu Ichi}",
note = "Funding Information: ACKKNOWLEDGEMENT This work has supported by JSPS KAKENHI Grant Numbers 17H01751 and 16H02831. Publisher Copyright: {\textcopyright} 2019 The Institute of Electronics, Information and Communication Engineer.; 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility, EMC Sapporo/APEMC 2019 ; Conference date: 03-06-2019 Through 07-06-2019",
year = "2019",
month = jun,
doi = "10.23919/EMCTokyo.2019.8893761",
language = "English",
series = "2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility, EMC Sapporo/APEMC 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "250--253",
booktitle = "2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility, EMC Sapporo/APEMC 2019",
address = "United States",
}