TY - JOUR
T1 - A simulation methodology for single-electron multiple-valued logics and its application to a latched parallel counter
AU - Inokawa, Hiroshi
AU - Takahashi, Yasuo
AU - Degawa, Katsuhiko
AU - Aoki, Takafumi
AU - Higuchi, Tatsuo
PY - 2004/11
Y1 - 2004/11
N2 - This paper introduces a methodology for simulating single-electron-transistor (SET)-based multiple-valued logics (MVLs). First, a physics-based analytical model for SET is described, and then a procedure for extracting parameters from measured characteristics is explained. After that, simulated and experimental results for basic MVL circuits are compared. As an advanced example of SET-based logics, a latched parallel counter, which is one of the most important components in arithmetic circuits, is newly designed and analyzed by a simulation. It is found that a SET-based 7-3 counter can be constructed with less than 1/10 the number of devices needed for a conventional circuit and can operate at a moderate speed with 1/100 the conventional power consumption.
AB - This paper introduces a methodology for simulating single-electron-transistor (SET)-based multiple-valued logics (MVLs). First, a physics-based analytical model for SET is described, and then a procedure for extracting parameters from measured characteristics is explained. After that, simulated and experimental results for basic MVL circuits are compared. As an advanced example of SET-based logics, a latched parallel counter, which is one of the most important components in arithmetic circuits, is newly designed and analyzed by a simulation. It is found that a SET-based 7-3 counter can be constructed with less than 1/10 the number of devices needed for a conventional circuit and can operate at a moderate speed with 1/100 the conventional power consumption.
KW - Analytical model
KW - Counter
KW - Multiple-valued logic (MVL)
KW - SPICE
KW - Single-electron transistor (SET)
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M3 - Article
AN - SCOPUS:10444270079
SN - 0916-8524
VL - E87-C
SP - 1818
EP - 1826
JO - IEICE Transactions on Electronics
JF - IEICE Transactions on Electronics
IS - 11
ER -