TY - JOUR
T1 - A statistical approach to correct x-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements
AU - Kato, Kenichi
AU - Tanaka, Yoshihito
AU - Yamauchi, Miho
AU - Ohara, Koji
AU - Hatsui, Takaki
N1 - Funding Information:
The authors thank Mr Kazuya Shigeta and Mr Kenta Ishino of RIKEN SPring-8 Center for their skilled technical contributions and fruitful discussions; and Professor Masaki Takata of Tohoku University and Dr Tetsuya Ishikawa of RIKEN SPring-8 Center for their support and encouragement. The synchrotron radiation experiments were performed at the BL44B2 of SPring-8 with the approval of RIKEN (Proposal Nos. 20130087, 20140055, 20150056 and 20160056). This work was supported by JSPS KAKENHI Grant Number JP16K04870 (to KK) and JST, PRESTO Grant Number JPMJPR1872, Japan (to KK).
Funding Information:
This work was supported by JSPS KAKENHI Grant Number JP16K04870 (to KK) and JST, PRESTO Grant Number JPMJPR1872, Japan (to KK).
Publisher Copyright:
© 2019, Wiley-Blackwell. All right reserved.
PY - 2019/5
Y1 - 2019/5
N2 - An unbiased approach to correct X-ray response non-uniformity in microstrip detectors has been developed based on the statistical estimation that the scattering intensity at a fixed angle from an object is expected to be constant within the Poisson noise. Raw scattering data of SiO2 glass measured by a microstrip detector module was found to show an accuracy of 12σPN at an intensity of 106 photons, where σPN is the standard deviation according to the Poisson noise. The conventional flat-field calibration has failed in correcting the data, whereas the alternative approach used in this article successfully improved the accuracy from 12σPN to 2σPN. This approach was applied to total-scattering data measured by a gapless 15-modular detector system. The quality of the data is evaluated in terms of the Bragg reflections of Si powder, the diffuse scattering of SiO2 glass, and the atomic pair distribution function of TiO2 nanoparticles and Ni powder.
AB - An unbiased approach to correct X-ray response non-uniformity in microstrip detectors has been developed based on the statistical estimation that the scattering intensity at a fixed angle from an object is expected to be constant within the Poisson noise. Raw scattering data of SiO2 glass measured by a microstrip detector module was found to show an accuracy of 12σPN at an intensity of 106 photons, where σPN is the standard deviation according to the Poisson noise. The conventional flat-field calibration has failed in correcting the data, whereas the alternative approach used in this article successfully improved the accuracy from 12σPN to 2σPN. This approach was applied to total-scattering data measured by a gapless 15-modular detector system. The quality of the data is evaluated in terms of the Bragg reflections of Si powder, the diffuse scattering of SiO2 glass, and the atomic pair distribution function of TiO2 nanoparticles and Ni powder.
KW - Flat-field calibration
KW - Microstrip detectors
KW - Pair distribution functions
KW - Poisson noise
KW - Total scattering
UR - http://www.scopus.com/inward/record.url?scp=85064003064&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85064003064&partnerID=8YFLogxK
U2 - 10.1107/S1600577519002145
DO - 10.1107/S1600577519002145
M3 - Article
C2 - 31074441
AN - SCOPUS:85064003064
SN - 0909-0495
VL - 26
SP - 762
EP - 773
JO - Journal of Synchrotron Radiation
JF - Journal of Synchrotron Radiation
IS - 3
ER -