A study on relationship between recording pattern and decoding reliability in SMR

R. Suzuto; Y. Nakamura; M. Nishikawa; H. Osawa; Y. Okamoto; Y. Kanai; H. Muraoka

doi:10.1109/INTMAG.2017.8007590

A study on relationship between recording pattern and decoding reliability in SMR

R. Suzuto, Y. Nakamura, M. Nishikawa, H. Osawa, Y. Okamoto, Y. Kanai, H. Muraoka

Broadband Engineering Division

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Hard disk drives (HDDs) have played the central role as the information storage system.

Original language	English
Title of host publication	2017 IEEE International Magnetics Conference, INTERMAG 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538610862
DOIs	https://doi.org/10.1109/INTMAG.2017.8007590
Publication status	Published - 2017 Aug 10
Event	2017 IEEE International Magnetics Conference, INTERMAG 2017 - Dublin, Ireland Duration: 2017 Apr 24 → 2017 Apr 28

Publication series

Name	2017 IEEE International Magnetics Conference, INTERMAG 2017

Other

Other	2017 IEEE International Magnetics Conference, INTERMAG 2017
Country/Territory	Ireland
City	Dublin
Period	17/4/24 → 17/4/28

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

Access to Document

10.1109/INTMAG.2017.8007590

Cite this

Suzuto, R., Nakamura, Y., Nishikawa, M., Osawa, H., Okamoto, Y., Kanai, Y., & Muraoka, H. (2017). A study on relationship between recording pattern and decoding reliability in SMR. In 2017 IEEE International Magnetics Conference, INTERMAG 2017 [8007590] (2017 IEEE International Magnetics Conference, INTERMAG 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2017.8007590

A study on relationship between recording pattern and decoding reliability in SMR. / Suzuto, R.; Nakamura, Y.; Nishikawa, M. et al.
2017 IEEE International Magnetics Conference, INTERMAG 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 8007590 (2017 IEEE International Magnetics Conference, INTERMAG 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Suzuto, R, Nakamura, Y, Nishikawa, M, Osawa, H, Okamoto, Y, Kanai, Y & Muraoka, H 2017, A study on relationship between recording pattern and decoding reliability in SMR. in 2017 IEEE International Magnetics Conference, INTERMAG 2017., 8007590, 2017 IEEE International Magnetics Conference, INTERMAG 2017, Institute of Electrical and Electronics Engineers Inc., 2017 IEEE International Magnetics Conference, INTERMAG 2017, Dublin, Ireland, 17/4/24. https://doi.org/10.1109/INTMAG.2017.8007590

Suzuto R, Nakamura Y, Nishikawa M, Osawa H, Okamoto Y, Kanai Y et al. A study on relationship between recording pattern and decoding reliability in SMR. In 2017 IEEE International Magnetics Conference, INTERMAG 2017. Institute of Electrical and Electronics Engineers Inc. 2017. 8007590. (2017 IEEE International Magnetics Conference, INTERMAG 2017). doi: 10.1109/INTMAG.2017.8007590

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A study on relationship between recording pattern and decoding reliability in SMR

Abstract

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Other

ASJC Scopus subject areas

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