ABSENCE OF SIDE-GATING IN InP MISFET INTEGRATED CIRCUITS.

H. Hasegawa, T. Kitagawa, H. Masuda, H. Yano, H. Ohno

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publicationConference on Solid State Devices and Materials
PublisherJapan Soc of Applied Physics
Pages425-428
Number of pages4
ISBN (Print)4930813107, 9784930813107
DOIs
Publication statusPublished - 1985

Publication series

NameConference on Solid State Devices and Materials

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