Abstract
Effects of titanium plate in contact with amalgams of 'Hi Atomic M' (HA) and 'Lumi Alloy' (LM) on the release of metal ions from those amalgams into 0.9% NaCl solution were investigated using inductively coupled plasma atomic emission spectroscopy, electron probe microanalysis and XPS. Except for Hg, the release of ions increased about ten times on Ti contact, whereas that of Hg was diminished several-fold. No measurable amounts of Ti ions were found in solution. Where the Ti is in contact with the amalgam, every element was deposited almost proportionally to the solution composition. Tin oxide containing several percent of In2O3 covered the top surface of Ti connected to the conventional HA amalgam. However, the dominant species on Ti connected to the high-copper LM amalgam were Cu and Sn oxides. On the Ti connected to the amalgams, the concentrations of other elements were very low.
Original language | English |
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Pages (from-to) | 144-147 |
Number of pages | 4 |
Journal | Surface and Interface Analysis |
Volume | 34 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2002 Aug |
Event | ECASIA'01 Proceedings of the 9th European Conference on Applications of Suface and Interface Analysis - Avignon, France Duration: 2001 Sept 30 → 2001 Oct 5 |
Keywords
- Adsorption
- Amalgam
- Dental alloy
- Released ion
- Surface analysis
- Titanium