Advanced electron microscopy for materials science

Zentaro Akase; Mitsuaki Higo; Keiko Shimada; Takafumi Sato; Hideyuki Magara; Daisuke Shindo; Nobuhiko Ohno

doi:10.2320/matertrans.MT-M2021086

Advanced electron microscopy for materials science

Zentaro Akase, Mitsuaki Higo, Keiko Shimada, Takafumi Sato, Hideyuki Magara, Daisuke Shindo, Nobuhiko Ohno

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

This paper presents current research trends in advanced electron microscopy techniques for materials science. The survey is based on the special issue of Materials Transactions published in October 2019 (Vol. 60, No. 10). Advanced electron microscopy has been applied extensively to characterize various materials. The recent development and extension of analyses of electric fields and the collective motions of secondary electrons by in situ electron holography are discussed in detail.

Original language	English
Pages (from-to)	1589-1595
Number of pages	7
Journal	Materials Transactions
Volume	62
Issue number	10
DOIs	https://doi.org/10.2320/matertrans.MT-M2021086
Publication status	Published - 2021 Oct 1

Keywords

Dynamical diffraction
Electric field
Electron holography
In situ experiment
Secondary electron

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10.2320/matertrans.MT-M2021086

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AU - Akase, Zentaro

AU - Higo, Mitsuaki

AU - Shimada, Keiko

AU - Sato, Takafumi

AU - Magara, Hideyuki

AU - Shindo, Daisuke

AU - Ohno, Nobuhiko

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KW - Electric field

KW - Electron holography

KW - In situ experiment

KW - Secondary electron

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Advanced electron microscopy for materials science

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Keywords

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