TY - GEN
T1 - Advanced tape expansion/assembly technology for FOWLP and micro-LED display
AU - Fukushima, T.
AU - Yonekura, H.
AU - Doi, F.
AU - Endo, S.
AU - Fushimi, T.
AU - Yanagimura, K.
AU - Koyanagi, M.
AU - Tanaka, T.
AU - Motoyoshi, M.
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - This paper describes advanced assembly technologies based on a new tape expansion technique with a selective UV irradiation method for the application of FOWLP (Fan-Out Wafer-Level Packaging) with millimeter-scale dies and micro-LED display with several tens of micrometer-scaled dielets. The assembly technologies allow us to uniformly expand expansion tapes in all direction and array the dies/dielets at the regular pitches desired for their products. We demonstrate the uniform expansion of an expansion tape with 3-mm-square Si dies and 50-μm-square Si dielets using selectively irradiated UV light through a photomask.
AB - This paper describes advanced assembly technologies based on a new tape expansion technique with a selective UV irradiation method for the application of FOWLP (Fan-Out Wafer-Level Packaging) with millimeter-scale dies and micro-LED display with several tens of micrometer-scaled dielets. The assembly technologies allow us to uniformly expand expansion tapes in all direction and array the dies/dielets at the regular pitches desired for their products. We demonstrate the uniform expansion of an expansion tape with 3-mm-square Si dies and 50-μm-square Si dielets using selectively irradiated UV light through a photomask.
UR - http://www.scopus.com/inward/record.url?scp=85062478202&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85062478202&partnerID=8YFLogxK
U2 - 10.1109/IMPACT.2018.8625835
DO - 10.1109/IMPACT.2018.8625835
M3 - Conference contribution
AN - SCOPUS:85062478202
T3 - Proceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT
SP - 210
EP - 213
BT - 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2018
PB - IEEE Computer Society
T2 - 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2018
Y2 - 24 October 2018 through 26 October 2018
ER -