TY - JOUR
T1 - Advances in EELS spectroscopy by using new detector and new specimen preparation technologies
AU - Scheu, Christina
AU - Gao, M.
AU - Van Benthem, K.
AU - Tsukimoto, S.
AU - Schmidt, S.
AU - Sigle, W.
AU - Richter, G.
AU - Thomas, J.
PY - 2003/4/1
Y1 - 2003/4/1
N2 - First results obtained with a Gatan UHV Enfina system, which was attached to a VG HB 501 UX dedicated STEM, are reported. The Enfina system is based on a CCD detector and offers, compared to the previously used photodiode array, a narrower point-spread function, higher sensitivity, and faster read-out capabilities. These improvements are demonstrated with electron energy-loss measurements on various oxides, such as Al2O3, TiO2 and SrTiO3. It is shown that a better energy resolution is achieved and that acquisition of high-energy absorption edges with a reasonable signal-to-noise ratio becomes possible. Furthermore, we report on the influence of the TEM specimen quality on the energy-loss spectra. Thin amorphous layers at the specimen surfaces, which are induced by ion-milling processes, can modify specific electron energy-loss near-edge structure features. We found that for the investigated ceramics the use of low-energy ion-milling systems is highly recommended, since the loss of energy-loss near-edge structure details by the presence of the amorphous layers is considerably reduced. This is especially true for very thin specimens.
AB - First results obtained with a Gatan UHV Enfina system, which was attached to a VG HB 501 UX dedicated STEM, are reported. The Enfina system is based on a CCD detector and offers, compared to the previously used photodiode array, a narrower point-spread function, higher sensitivity, and faster read-out capabilities. These improvements are demonstrated with electron energy-loss measurements on various oxides, such as Al2O3, TiO2 and SrTiO3. It is shown that a better energy resolution is achieved and that acquisition of high-energy absorption edges with a reasonable signal-to-noise ratio becomes possible. Furthermore, we report on the influence of the TEM specimen quality on the energy-loss spectra. Thin amorphous layers at the specimen surfaces, which are induced by ion-milling processes, can modify specific electron energy-loss near-edge structure features. We found that for the investigated ceramics the use of low-energy ion-milling systems is highly recommended, since the loss of energy-loss near-edge structure details by the presence of the amorphous layers is considerably reduced. This is especially true for very thin specimens.
KW - CCD-based detector
KW - EELS
KW - ELNES
KW - Specimen preparation
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U2 - 10.1046/j.1365-2818.2003.01181.x
DO - 10.1046/j.1365-2818.2003.01181.x
M3 - Article
C2 - 12694412
AN - SCOPUS:0037392295
SN - 0022-2720
VL - 210
SP - 16
EP - 24
JO - Journal of Microscopy
JF - Journal of Microscopy
IS - 1
ER -