TY - GEN
T1 - Air-stable, low-voltage organic transistors
T2 - 72nd Device Research Conference, DRC 2014
AU - Kraft, U.
AU - Sejfie, M.
AU - Zaki, T.
AU - Letzkus, F.
AU - Burghartz, J. N.
AU - Takimiya, K.
AU - Weber, E.
AU - Klauk, H.
PY - 2014
Y1 - 2014
N2 - The organic semiconductor DNTT (dinaphtho-[2,3-b:2',3'-f]thieno[3,2-b] thiophene) and its didecyl- and diphenyl derivatives C10-DNTT and DPh-DNTT [1-3] have recently shown exceptionally large field-effect mobilities together with excellent air stability [4]. Here we present a detailed analysis of the mobility, contact resistance, air stability and signal delay (measured in unipolar as well as complementary ring oscillators) of low-voltage (∼3 V) thin-film transistors (TFTs) based on these semiconductors with channel lengths down to 0.5 μm on flexible plastic substrates. The TFTs were fabricated with an inverted staggered device structure and with Al gate electrodes, a gate dielectric composed of a plasma-grown AlOx layer (3.6 nm thick) and a tetradecylphosphonic acid self-assembled monolayer (SAM), a vacuum-deposited organic semiconductor layer (25 nm), and Au source and drain contacts [4]. The fabrication of organic TFTs with channel lengths as short as 0.5 μm was accomplished using high-resolution silicon stencil masks [6,7]. All measurements were performed in ambient air.
AB - The organic semiconductor DNTT (dinaphtho-[2,3-b:2',3'-f]thieno[3,2-b] thiophene) and its didecyl- and diphenyl derivatives C10-DNTT and DPh-DNTT [1-3] have recently shown exceptionally large field-effect mobilities together with excellent air stability [4]. Here we present a detailed analysis of the mobility, contact resistance, air stability and signal delay (measured in unipolar as well as complementary ring oscillators) of low-voltage (∼3 V) thin-film transistors (TFTs) based on these semiconductors with channel lengths down to 0.5 μm on flexible plastic substrates. The TFTs were fabricated with an inverted staggered device structure and with Al gate electrodes, a gate dielectric composed of a plasma-grown AlOx layer (3.6 nm thick) and a tetradecylphosphonic acid self-assembled monolayer (SAM), a vacuum-deposited organic semiconductor layer (25 nm), and Au source and drain contacts [4]. The fabrication of organic TFTs with channel lengths as short as 0.5 μm was accomplished using high-resolution silicon stencil masks [6,7]. All measurements were performed in ambient air.
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U2 - 10.1109/DRC.2014.6872407
DO - 10.1109/DRC.2014.6872407
M3 - Conference contribution
AN - SCOPUS:84906544456
SN - 9781479954056
T3 - Device Research Conference - Conference Digest, DRC
SP - 283
EP - 284
BT - 72nd Device Research Conference, DRC 2014 - Conference Digest
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 22 June 2014 through 25 June 2014
ER -