TY - JOUR
T1 - An active magnetic probe array for the multiple-point concurrent measurement of electromagnetic emissions
AU - Aoyama, Satoshi
AU - Kawahito, Shoji
AU - Yamaguchi, Masahiro
N1 - Funding Information:
This work was supported in part by the Ministry of Education, Culture, Sports, Science and Technology under the 21st Century COE Program on “Nanovision Science.” The VLSI chip in this work has been fabricated in the chip fabrication program of VLSI Design and Education Center (VDEC), the University of Tokyo in collaboration with Oki Electric Industry Co., Ltd.
PY - 2006/10
Y1 - 2006/10
N2 - In order to diagnose the EMI (Electromagnetic Interference) problem of ICs, an integrated active magnetic probe array has been developed in SOI (Silicon On Insulator)-CMOS technology. Three aligned differential coils, differential amplifiers, a differential to single-ended converter, an output buffer and bias circuits are all integrated in a single-chip. A measurement result shows that the probe achieves an e-field suppression ratio of 33.6 dB at 50 MHz. Furthermore, a two-dimensional magnetic field distribution map is drawn by the probe array using the 3-point concurrent measurement. The obtained image gains three times higher resolution than that of a single scan under an identical condition.
AB - In order to diagnose the EMI (Electromagnetic Interference) problem of ICs, an integrated active magnetic probe array has been developed in SOI (Silicon On Insulator)-CMOS technology. Three aligned differential coils, differential amplifiers, a differential to single-ended converter, an output buffer and bias circuits are all integrated in a single-chip. A measurement result shows that the probe achieves an e-field suppression ratio of 33.6 dB at 50 MHz. Furthermore, a two-dimensional magnetic field distribution map is drawn by the probe array using the 3-point concurrent measurement. The obtained image gains three times higher resolution than that of a single scan under an identical condition.
KW - Arrays
KW - Electromagnetic compatibility
KW - Electromagnetic interference
KW - Electromagnetic measurements
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U2 - 10.1109/TMAG.2006.879763
DO - 10.1109/TMAG.2006.879763
M3 - Article
AN - SCOPUS:33846635829
SN - 0018-9464
VL - 42
SP - 3303
EP - 3305
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 10
ER -