An application of thermal microscopes to the measurement of thermal effusivity of films

Kimihito Hatori; Kei Suzuki; Hiroyuki Fukuyama; Hiromichi Ohta

doi:10.1002/htj.20227

An application of thermal microscopes to the measurement of thermal effusivity of films

Kimihito Hatori, Kei Suzuki, Hiroyuki Fukuyama, Hiromichi Ohta

Center for Mineral Processing and Metallurgy (CMPM)

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

The application of thermal microscopes to the measurement of local thermal properties has drawn considerable scientific interest. We report on the application of a thermal microscope to the measurement of thermal effusivity for films comprising alumina deposited on a substrate, which were fabricated by an electrophoretic deposition method. The measured data was analyzed to consider the undulations on the sample surface. The thermal effusivity of these samples was approximately 1 × 10³ Js^-0.5m^-2K^-1; this value is smaller than that for dense alumina because the alumina grain makes contact with a point.

Original language	English
Pages (from-to)	57-64
Number of pages	8
Journal	Heat Transfer - Asian Research
Volume	38
Issue number	1
DOIs	https://doi.org/10.1002/htj.20227
Publication status	Published - 2009 Jun 4

Keywords

Thermal effusivity
Thermal microscope
Thin film
Undulation

ASJC Scopus subject areas

Condensed Matter Physics
Fluid Flow and Transfer Processes

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10.1002/htj.20227

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AB - The application of thermal microscopes to the measurement of local thermal properties has drawn considerable scientific interest. We report on the application of a thermal microscope to the measurement of thermal effusivity for films comprising alumina deposited on a substrate, which were fabricated by an electrophoretic deposition method. The measured data was analyzed to consider the undulations on the sample surface. The thermal effusivity of these samples was approximately 1 × 103 Js-0.5m-2K-1; this value is smaller than that for dense alumina because the alumina grain makes contact with a point.

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KW - Undulation

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An application of thermal microscopes to the measurement of thermal effusivity of films

Abstract

Keywords

ASJC Scopus subject areas

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