An electron-beam profile monitor using fresnel zone plates

Norio Nakamura, Hiroshi Sakai, Kensuke Iida, Kenji Shinoe, Hiroyuki Takaki, Masami Fujisawa, Hitoshi Hayano, Toshiya Muto, Masaharu Nomura, Yukihide Kamiya, Tadashi Koseki, Yoshiyuki Amemiya, Nobutada Aoki, Koichi Nakayama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


We have developed a beam profile monitor using two Fresnel zone plates (FZPs) at the KEK-ATF (Accelerator Test Facility) damping ring to measure small electron-beam sizes for low-emittance synchrotron radiation sources. The monitor has a structure of an X-ray microscope, where two FZPs constitute an X-ray imaging optics. In the monitor system, the synchrotron radiation from the electron beam at the bending magnet is monochromatized to 3.235-keV X-rays by a crystal monochromator and the transverse electron-beam image is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. This monitor has the following advantages: (1) high spatial resolution, (2) non-destructive measurement, (3) real-time monitoring and (4) direct electron-beam imaging. With the beam profile monitor, we have succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 μm. The measured magnification of the imaging optics was in good agreement with the design value.

Original languageEnglish
Title of host publicationSynchrotron Radiation Instrumentation
Subtitle of host publication8th International Conference on Synchrotron Radiation Instrumentation
PublisherAmerican Institute of Physics Inc.
Number of pages4
ISBN (Electronic)0735401799
Publication statusPublished - 2004 May 12
Externally publishedYes
Event8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
Duration: 2003 Aug 252003 Aug 29

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


Other8th International Conference on Synchrotron Radiation Instrumentation
Country/TerritoryUnited States
CitySan Francisco

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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