An electron-beam profile monitor using fresnel zone plates

Norio Nakamura; Hiroshi Sakai; Kensuke Iida; Kenji Shinoe; Hiroyuki Takaki; Masami Fujisawa; Hitoshi Hayano; Toshiya Muto; Masaharu Nomura; Yukihide Kamiya; Tadashi Koseki; Yoshiyuki Amemiya; Nobutada Aoki; Koichi Nakayama

doi:10.1063/1.1757854

An electron-beam profile monitor using fresnel zone plates

Norio Nakamura, Hiroshi Sakai, Kensuke Iida, Kenji Shinoe, Hiroyuki Takaki, Masami Fujisawa, Hitoshi Hayano, Toshiya Muto, Masaharu Nomura, Yukihide Kamiya, Tadashi Koseki, Yoshiyuki Amemiya, Nobutada Aoki, Koichi Nakayama

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We have developed a beam profile monitor using two Fresnel zone plates (FZPs) at the KEK-ATF (Accelerator Test Facility) damping ring to measure small electron-beam sizes for low-emittance synchrotron radiation sources. The monitor has a structure of an X-ray microscope, where two FZPs constitute an X-ray imaging optics. In the monitor system, the synchrotron radiation from the electron beam at the bending magnet is monochromatized to 3.235-keV X-rays by a crystal monochromator and the transverse electron-beam image is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. This monitor has the following advantages: (1) high spatial resolution, (2) non-destructive measurement, (3) real-time monitoring and (4) direct electron-beam imaging. With the beam profile monitor, we have succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 μm. The measured magnification of the imaging optics was in good agreement with the design value.

Original language	English
Title of host publication	Synchrotron Radiation Instrumentation
Subtitle of host publication	8th International Conference on Synchrotron Radiation Instrumentation
Publisher	American Institute of Physics Inc.
Pages	545-548
Number of pages	4
ISBN (Electronic)	0735401799
DOIs	https://doi.org/10.1063/1.1757854
Publication status	Published - 2004 May 12
Externally published	Yes
Event	8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States Duration: 2003 Aug 25 → 2003 Aug 29

Publication series

Name	AIP Conference Proceedings
Volume	705
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Other

Other	8th International Conference on Synchrotron Radiation Instrumentation
Country/Territory	United States
City	San Francisco
Period	03/8/25 → 03/8/29

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.1757854

Cite this

Nakamura, N., Sakai, H., Iida, K., Shinoe, K., Takaki, H., Fujisawa, M., Hayano, H., Muto, T., Nomura, M., Kamiya, Y., Koseki, T., Amemiya, Y., Aoki, N., & Nakayama, K. (2004). An electron-beam profile monitor using fresnel zone plates. In Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation (pp. 545-548). (AIP Conference Proceedings; Vol. 705). American Institute of Physics Inc.. https://doi.org/10.1063/1.1757854

An electron-beam profile monitor using fresnel zone plates. / Nakamura, Norio; Sakai, Hiroshi; Iida, Kensuke et al.
Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. American Institute of Physics Inc., 2004. p. 545-548 (AIP Conference Proceedings; Vol. 705).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Nakamura, N, Sakai, H, Iida, K, Shinoe, K, Takaki, H, Fujisawa, M, Hayano, H, Muto, T, Nomura, M, Kamiya, Y, Koseki, T, Amemiya, Y, Aoki, N & Nakayama, K 2004, An electron-beam profile monitor using fresnel zone plates. in Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. AIP Conference Proceedings, vol. 705, American Institute of Physics Inc., pp. 545-548, 8th International Conference on Synchrotron Radiation Instrumentation, San Francisco, United States, 03/8/25. https://doi.org/10.1063/1.1757854

@inproceedings{10a5e606536d430789532fc25a75c2cf,

title = "An electron-beam profile monitor using fresnel zone plates",

abstract = "We have developed a beam profile monitor using two Fresnel zone plates (FZPs) at the KEK-ATF (Accelerator Test Facility) damping ring to measure small electron-beam sizes for low-emittance synchrotron radiation sources. The monitor has a structure of an X-ray microscope, where two FZPs constitute an X-ray imaging optics. In the monitor system, the synchrotron radiation from the electron beam at the bending magnet is monochromatized to 3.235-keV X-rays by a crystal monochromator and the transverse electron-beam image is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. This monitor has the following advantages: (1) high spatial resolution, (2) non-destructive measurement, (3) real-time monitoring and (4) direct electron-beam imaging. With the beam profile monitor, we have succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 μm. The measured magnification of the imaging optics was in good agreement with the design value.",

author = "Norio Nakamura and Hiroshi Sakai and Kensuke Iida and Kenji Shinoe and Hiroyuki Takaki and Masami Fujisawa and Hitoshi Hayano and Toshiya Muto and Masaharu Nomura and Yukihide Kamiya and Tadashi Koseki and Yoshiyuki Amemiya and Nobutada Aoki and Koichi Nakayama",

note = "Publisher Copyright: {\textcopyright} 2004 American Institute of Physics.; 8th International Conference on Synchrotron Radiation Instrumentation ; Conference date: 25-08-2003 Through 29-08-2003",

year = "2004",

month = may,

day = "12",

doi = "10.1063/1.1757854",

language = "English",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics Inc.",

pages = "545--548",

booktitle = "Synchrotron Radiation Instrumentation",

}

TY - GEN

T1 - An electron-beam profile monitor using fresnel zone plates

AU - Nakamura, Norio

AU - Sakai, Hiroshi

AU - Iida, Kensuke

AU - Shinoe, Kenji

AU - Takaki, Hiroyuki

AU - Fujisawa, Masami

AU - Hayano, Hitoshi

AU - Muto, Toshiya

AU - Nomura, Masaharu

AU - Kamiya, Yukihide

AU - Koseki, Tadashi

AU - Amemiya, Yoshiyuki

AU - Aoki, Nobutada

AU - Nakayama, Koichi

PY - 2004/5/12

Y1 - 2004/5/12

N2 - We have developed a beam profile monitor using two Fresnel zone plates (FZPs) at the KEK-ATF (Accelerator Test Facility) damping ring to measure small electron-beam sizes for low-emittance synchrotron radiation sources. The monitor has a structure of an X-ray microscope, where two FZPs constitute an X-ray imaging optics. In the monitor system, the synchrotron radiation from the electron beam at the bending magnet is monochromatized to 3.235-keV X-rays by a crystal monochromator and the transverse electron-beam image is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. This monitor has the following advantages: (1) high spatial resolution, (2) non-destructive measurement, (3) real-time monitoring and (4) direct electron-beam imaging. With the beam profile monitor, we have succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 μm. The measured magnification of the imaging optics was in good agreement with the design value.

AB - We have developed a beam profile monitor using two Fresnel zone plates (FZPs) at the KEK-ATF (Accelerator Test Facility) damping ring to measure small electron-beam sizes for low-emittance synchrotron radiation sources. The monitor has a structure of an X-ray microscope, where two FZPs constitute an X-ray imaging optics. In the monitor system, the synchrotron radiation from the electron beam at the bending magnet is monochromatized to 3.235-keV X-rays by a crystal monochromator and the transverse electron-beam image is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. This monitor has the following advantages: (1) high spatial resolution, (2) non-destructive measurement, (3) real-time monitoring and (4) direct electron-beam imaging. With the beam profile monitor, we have succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 μm. The measured magnification of the imaging optics was in good agreement with the design value.

UR - http://www.scopus.com/inward/record.url?scp=85012303669&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85012303669&partnerID=8YFLogxK

U2 - 10.1063/1.1757854

DO - 10.1063/1.1757854

M3 - Conference contribution

AN - SCOPUS:85012303669

T3 - AIP Conference Proceedings

SP - 545

EP - 548

BT - Synchrotron Radiation Instrumentation

PB - American Institute of Physics Inc.

T2 - 8th International Conference on Synchrotron Radiation Instrumentation

Y2 - 25 August 2003 through 29 August 2003

ER -

An electron-beam profile monitor using fresnel zone plates

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