TY - GEN
T1 - An impact of circuit scale on the performance of 3-D stacked arithmetic units
AU - Tada, Jubee
AU - Egawa, Ryusuke
AU - Kobayashi, Hiroaki
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014
Y1 - 2014
N2 - Recently, the 3-D stacked integrated circuit technology has been expected to overcome the limitations in the design of the 2-D implemented microprocessors. This paper examines the potential of 3-D integration in design and implementation of large-scale arithmetic units. In this paper, 3-D stacked parallel multipliers with various operand sizes are designed, and the effect of circuit scale on the performance of 3-D stacked multipliers is discussed. In the design of a large-scale parallel multiplier, a lot of through-silicon-vias are required by the conventional partitioning pattern. This paper proposes a partitioning pattern suitable for a large-scale 3-D stacked parallel multiplier. The proposed partitioning pattern aims to reduce the number of TSVs with a large-scale parallel multiplier. Based on the proposed partitioning pattern, 3-D stacked 32, 64, and 128-bit multipliers are designed and evaluated. The proposed partitioning pattern achieves a 13.4% reduction in critical path delay and a 10.4% reduction in power consumption compared to the 2-D implementation, in the case of an 128-bit four-layer implemented 3-D stacked multiplier.
AB - Recently, the 3-D stacked integrated circuit technology has been expected to overcome the limitations in the design of the 2-D implemented microprocessors. This paper examines the potential of 3-D integration in design and implementation of large-scale arithmetic units. In this paper, 3-D stacked parallel multipliers with various operand sizes are designed, and the effect of circuit scale on the performance of 3-D stacked multipliers is discussed. In the design of a large-scale parallel multiplier, a lot of through-silicon-vias are required by the conventional partitioning pattern. This paper proposes a partitioning pattern suitable for a large-scale 3-D stacked parallel multiplier. The proposed partitioning pattern aims to reduce the number of TSVs with a large-scale parallel multiplier. Based on the proposed partitioning pattern, 3-D stacked 32, 64, and 128-bit multipliers are designed and evaluated. The proposed partitioning pattern achieves a 13.4% reduction in critical path delay and a 10.4% reduction in power consumption compared to the 2-D implementation, in the case of an 128-bit four-layer implemented 3-D stacked multiplier.
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U2 - 10.1109/3DIC.2014.7152185
DO - 10.1109/3DIC.2014.7152185
M3 - Conference contribution
AN - SCOPUS:84963878668
T3 - 2014 International 3D Systems Integration Conference, 3DIC 2014 - Proceedings
BT - 2014 International 3D Systems Integration Conference, 3DIC 2014 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - International 3D Systems Integration Conference, 3DIC 2014
Y2 - 1 December 2014 through 3 December 2014
ER -