Abstract
Transmission electron microscopy observation of cross-sectional specimens prepared by focused ion beam milling method have been applied to study the deep radiation damage and depth profile of point defects generated during ion irradiation in Cu-1 mass%Co alloy specimens by means of coherent precipitates. The specimens were irradiated at a temperature range of 250 to 500' C by 4 and 0.6 MeV self Cu ions to a dose of 0.3 dpa. The damage range has been observed at depths well beyond that expected from ion damage range calculations.
Original language | English |
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Pages (from-to) | 259-262 |
Number of pages | 4 |
Journal | Materials Transactions |
Volume | 47 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2006 Feb |
Keywords
- Depth profile
- Ion irradiation
- Point defect
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering