TY - GEN
T1 - ANALYSIS OF MULTIPLE LAYER SURFACE FILMS BY MODULATED REFLECTION SPECTROSCOPY.
AU - Hara, N.
AU - Sugimoto, K.
PY - 1983
Y1 - 1983
N2 - Methods for qualitative and quantitative analyses of thin multiple layer surface films by modulated reflection spectroscopy have been studied using single- and two-layer films of gamma -Fe//2O//3 and Cr//2O//3 and single-layer films of composite oxide of Fe//2O//3-Cr//2O//3 prepared by CVD technique. The application of the methods to the in situ analysis of passive films is demonstrated on Fe-Cr alloys in solutions. (Author abstract. )
AB - Methods for qualitative and quantitative analyses of thin multiple layer surface films by modulated reflection spectroscopy have been studied using single- and two-layer films of gamma -Fe//2O//3 and Cr//2O//3 and single-layer films of composite oxide of Fe//2O//3-Cr//2O//3 prepared by CVD technique. The application of the methods to the in situ analysis of passive films is demonstrated on Fe-Cr alloys in solutions. (Author abstract. )
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U2 - 10.1016/b978-0-444-42252-1.50038-2
DO - 10.1016/b978-0-444-42252-1.50038-2
M3 - Conference contribution
AN - SCOPUS:0020991270
SN - 0444422528
SN - 9780444422521
T3 - Thin Films Science and Technology
SP - 211
EP - 216
BT - Thin Films Science and Technology
PB - Elsevier
ER -