ANALYSIS OF THE ATOMIC STRUCTURE OF THE Si(111) ROOT 3 multiplied by ROOT 3 - Bi SURFACE BY X-RAY PHOTOELECTRON DIFFRACTION.

Chong Yun Park; Tadashi Abukawa; Kazuyuki Higashiyama; Shozo Kono

ANALYSIS OF THE ATOMIC STRUCTURE OF THE Si(111) ROOT 3 multiplied by ROOT 3 - Bi SURFACE BY X-RAY PHOTOELECTRON DIFFRACTION.

Chong Yun Park, Tadashi Abukawa, Kazuyuki Higashiyama, Shozo Kono

SRIS - SR Core Research Division

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14 Citations (Scopus)

Abstract

It is found by X-ray photoelectron spectroscopy and LEED that the saturation coverage of Bi is one monolayer for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface. Azimuthal dependence of Bi 4d photoelectron diffraction has been measured for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface and analyzed kinematically. The results of the analysis have confirmed the presence of Bi-triplets with sides of 3. 1 A as proposed by X-ray diffraction. It is further found that the Bi-triplets form an overlayer on the substrate.

Original language	English
Pages (from-to)	1335-1337
Number of pages	3
Journal	Japanese Journal of Applied Physics
Volume	26
Issue number	8
Publication status	Published - 1987 Aug

Cite this

@article{7384215259794d858015d610a455ba13,

title = "ANALYSIS OF THE ATOMIC STRUCTURE OF THE Si(111) ROOT 3 multiplied by ROOT 3 - Bi SURFACE BY X-RAY PHOTOELECTRON DIFFRACTION.",

abstract = "It is found by X-ray photoelectron spectroscopy and LEED that the saturation coverage of Bi is one monolayer for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface. Azimuthal dependence of Bi 4d photoelectron diffraction has been measured for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface and analyzed kinematically. The results of the analysis have confirmed the presence of Bi-triplets with sides of 3. 1 A as proposed by X-ray diffraction. It is further found that the Bi-triplets form an overlayer on the substrate.",

author = "Park, {Chong Yun} and Tadashi Abukawa and Kazuyuki Higashiyama and Shozo Kono",

year = "1987",

month = aug,

language = "English",

volume = "26",

pages = "1335--1337",

journal = "Japanese Journal of Applied Physics",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "8",

}

TY - JOUR

T1 - ANALYSIS OF THE ATOMIC STRUCTURE OF THE Si(111) ROOT 3 multiplied by ROOT 3 - Bi SURFACE BY X-RAY PHOTOELECTRON DIFFRACTION.

AU - Park, Chong Yun

AU - Abukawa, Tadashi

AU - Higashiyama, Kazuyuki

AU - Kono, Shozo

PY - 1987/8

Y1 - 1987/8

N2 - It is found by X-ray photoelectron spectroscopy and LEED that the saturation coverage of Bi is one monolayer for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface. Azimuthal dependence of Bi 4d photoelectron diffraction has been measured for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface and analyzed kinematically. The results of the analysis have confirmed the presence of Bi-triplets with sides of 3. 1 A as proposed by X-ray diffraction. It is further found that the Bi-triplets form an overlayer on the substrate.

AB - It is found by X-ray photoelectron spectroscopy and LEED that the saturation coverage of Bi is one monolayer for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface. Azimuthal dependence of Bi 4d photoelectron diffraction has been measured for the Si(111) ROOT 3 multiplied by ROOT 3-Bi surface and analyzed kinematically. The results of the analysis have confirmed the presence of Bi-triplets with sides of 3. 1 A as proposed by X-ray diffraction. It is further found that the Bi-triplets form an overlayer on the substrate.

UR - http://www.scopus.com/inward/record.url?scp=0023387951&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023387951&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0023387951

SN - 0021-4922

VL - 26

SP - 1335

EP - 1337

JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

IS - 8

ER -

ANALYSIS OF THE ATOMIC STRUCTURE OF THE Si(111) ROOT 3 multiplied by ROOT 3 - Bi SURFACE BY X-RAY PHOTOELECTRON DIFFRACTION.

Abstract

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