Abstract
The electronic energy-band properties of epitaxially grown YBa2CuO3O7-x(001) single-crystal thin films have been investigated by angle-resolved ultraviolet photoemission spectroscopy (ARUPS) with synchrotron radiation as the light source. The (001) surfaces exhibit sharp (1×1) low-energy electron-diffraction patterns. Our ARUPS data show a clear Fermi edge and dispersive nature of the valence bands, suggesting the validity of the band concept for this oxide. We determined energy-band dispersion along the directions in the bulk Brillouin zone. The experimental results are compared with the existing ground-state band calculations.
Original language | English |
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Pages (from-to) | 9080-9090 |
Number of pages | 11 |
Journal | Physical Review B |
Volume | 39 |
Issue number | 13 |
DOIs | |
Publication status | Published - 1989 |