Anomalous Hall-effect measurement study on CoPt nanosized dot

N. Kikuchi, R. Murillo, J. C. Lodder

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8 Citations (Scopus)


Dot arrays made of polycrystalline CoPt multilayer with an average grain size of 20 nm are fabricated by using a laser interference lithography and their magnetic properties are examined by detecting anomalous Hall effect. It is revealed that the ratio of dots which have stable single domain state increases from 35% to 85% while the dot diameter decreased from 200 to 120 nm. The energy barrier height of magnetization reversal is estimated as 4.0× 10-12 erg from sweep rate dependence of the coercivity. The energy corresponds to the switching volume comparable with the volume of a physical grain in the multilayer film.

Original languageEnglish
Article number10J713
JournalJournal of Applied Physics
Issue number10
Publication statusPublished - 2005 May 15


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