Application of FIB system to ultra-high-pressure Earth science

Masaaki Miyahara, Takeshi Sakai, Eiji Ohtani, Yusuke Kobayashi, Seiji Kamada, Tadashi Kondo, Toshiro Nagase, Jung Ho Yoo, Masahiko Nishijima, Zahra Vashaei

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)


The conventional focused ion beam (FIB) sample preparation technique "lift-out method" was modified for the reliable analysis of a laser-heated diamond anvil cell (LHDAC) sample. Box-shaped grooves were prepared in the LHDAC specimen in order to recover a block using a gallium ion beam in the vicinity of the area to be characterized by transmission electron microscope (TEM). The recovered block was fixed on the stage of a copper (or molybdenum) grid and thinned by the gallium ion beam in order to obtain a TEM foil. Our modified lift-out method allows us to thin the entire vertical section (from the upper anvil surface to the lower anvil surface) of the LHDAC sample.

Original languageEnglish
Pages (from-to)88-93
Number of pages6
JournalJournal of Mineralogical and Petrological Sciences
Issue number2
Publication statusPublished - 2008


  • Diamond anvil cell
  • FIB
  • Lift-out method
  • TEM

ASJC Scopus subject areas

  • Geophysics
  • Geology


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