Abstract
The conventional focused ion beam (FIB) sample preparation technique "lift-out method" was modified for the reliable analysis of a laser-heated diamond anvil cell (LHDAC) sample. Box-shaped grooves were prepared in the LHDAC specimen in order to recover a block using a gallium ion beam in the vicinity of the area to be characterized by transmission electron microscope (TEM). The recovered block was fixed on the stage of a copper (or molybdenum) grid and thinned by the gallium ion beam in order to obtain a TEM foil. Our modified lift-out method allows us to thin the entire vertical section (from the upper anvil surface to the lower anvil surface) of the LHDAC sample.
Original language | English |
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Pages (from-to) | 88-93 |
Number of pages | 6 |
Journal | Journal of Mineralogical and Petrological Sciences |
Volume | 103 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2008 |
Keywords
- Diamond anvil cell
- FIB
- Lift-out method
- TEM
ASJC Scopus subject areas
- Geophysics
- Geology