@article{13d0c159ce6c4fb0b5813eb418b1684f,
title = "Application of X-ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film",
abstract = "We report on the characterization of a thin film of yttrium oxide by X-ray fluorescence holography. The sample has a layered structure with an YO base layer and an oxidized Y2O3 surface. Both layers are clearly observed in the atomic image reconstructions, and their local structure is analyzed. We show that by using incident energies close to the absorption edge of the fluorescing atom, it becomes possible to observe the thin surface layer clearly, even next to a base layer containing the same fluorescing element.",
keywords = "X-ray fluorescence holography, thin-film analysis, yttrium oxide",
author = "Stellhorn, {Jens R.} and Shinya Hosokawa and Naohisa Happo and Hiroo Tajiri and Tomohiro Matsushita and Kenichi Kaminaga and Tomoteru Fukumura and Tetsuya Hasegawa and Koji Kimura and Koichi Hayashi",
note = "Funding Information: The XFH experiments have been performed at BL13XU/SPring-8 (Exp. No: 2015A0116 and 2017A0116). This work was supported by the Japan Society for the Promotion of Science (JSPS) Grant-in-Aid for Scientific Research on Innovative Areas {\textquoteleft}{\textquoteleft}3D Active-Site Science{\textquoteright}{\textquoteright} (No. 26105006). J.R.S gratefully acknowledges financial support as Overseas Researcher under the Postdoctoral Fellowship of JSPS (No. P16796). Funding Information: Japan Society for the Promotion of Science , Grant/Award Number: 3D Active-Site Science 26105006 and Postdoctoral Fellowship P16796 Publisher Copyright: {\textcopyright} 2018 John Wiley & Sons, Ltd.",
year = "2019",
month = jan,
doi = "10.1002/sia.6550",
language = "English",
volume = "51",
pages = "70--73",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "1",
}