Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO                         2

K. Takahiro; S. Oizumi; K. Morimoto; K. Kawatsura; T. Isshiki; K. Nishio; S. Nagata; S. Yamamoto; K. Narumi; H. Naramoto

doi:10.1016/j.apsusc.2009.05.104

Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO ₂

K. Takahiro, S. Oizumi, K. Morimoto, K. Kawatsura, T. Isshiki, K. Nishio, S. Nagata, S. Yamamoto, K. Narumi, H. Naramoto

Materials Design Division

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

In X-ray photoelectron spectroscopy (XPS) of Au nanoparticles, the width of 5d valence band changes with Au particle size. This enables us to estimate the size of Au nanoparticles by using XPS. In this work, the 5d-band width has been measured for Au nanoparticles formed by ion implantation into SiO ₂ . The 5d-band width is found to be correlated strongly with the Au concentration. As the Au concentration increases, the 5d-band width becomes larger, indicating that the Au nanoparticles with the larger size tend to be formed in the vicinity of the projected range of Au ions. This correlation agrees very well with the results from transmission electron microscopy.

Original language	English
Pages (from-to)	1061-1064
Number of pages	4
Journal	Applied Surface Science
Volume	256
Issue number	4
DOIs	https://doi.org/10.1016/j.apsusc.2009.05.104
Publication status	Published - 2009 Nov 30

Keywords

Au
Ion implantation
Nanoparticle
SiO
Valence band
X-ray photoelectron spectroscopy

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

Access to Document

10.1016/j.apsusc.2009.05.104

Cite this

Takahiro, K., Oizumi, S., Morimoto, K., Kawatsura, K., Isshiki, T., Nishio, K., Nagata, S., Yamamoto, S., Narumi, K., & Naramoto, H. (2009). Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO ₂ Applied Surface Science, 256(4), 1061-1064. https://doi.org/10.1016/j.apsusc.2009.05.104

Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO ₂ . / Takahiro, K.; Oizumi, S.; Morimoto, K. et al.

In: Applied Surface Science, Vol. 256, No. 4, 30.11.2009, p. 1061-1064.

Research output: Contribution to journal › Article › peer-review

Takahiro, K, Oizumi, S, Morimoto, K, Kawatsura, K, Isshiki, T, Nishio, K, Nagata, S, Yamamoto, S, Narumi, K & Naramoto, H 2009, ' Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO ₂ ', Applied Surface Science, vol. 256, no. 4, pp. 1061-1064. https://doi.org/10.1016/j.apsusc.2009.05.104

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abstract = " In X-ray photoelectron spectroscopy (XPS) of Au nanoparticles, the width of 5d valence band changes with Au particle size. This enables us to estimate the size of Au nanoparticles by using XPS. In this work, the 5d-band width has been measured for Au nanoparticles formed by ion implantation into SiO 2 . The 5d-band width is found to be correlated strongly with the Au concentration. As the Au concentration increases, the 5d-band width becomes larger, indicating that the Au nanoparticles with the larger size tend to be formed in the vicinity of the projected range of Au ions. This correlation agrees very well with the results from transmission electron microscopy.",

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AU - Takahiro, K.

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AU - Morimoto, K.

AU - Kawatsura, K.

AU - Isshiki, T.

AU - Nishio, K.

AU - Nagata, S.

AU - Yamamoto, S.

AU - Narumi, K.

AU - Naramoto, H.

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