Abstract
Three sets of uniaxial tensile tests have been performed in situ in transmission electron microscopy/high-resolution electron microscopy on Cu nanowires (NWs) to accurately map out the sample size dependence of elastic strain limit. Atomic-resolution evidence was obtained for an exceedingly large recoverable strain (as much as 7.2%) that can be sustained in the lattice of a single-crystalline Cu NW with a diameter of ∼5.8 nm. This ultrahigh elastic strain is consistent with the predictions from molecular dynamics simulations for nanowires and approaches the ideal elastic limit predicted for Cu by ab initio calculations.
Original language | English |
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Pages (from-to) | 3151-3155 |
Number of pages | 5 |
Journal | Nano Letters |
Volume | 11 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2011 Aug 10 |
Keywords
- Theoretical elastic limit
- copper nanowire
- in situ TEM
- size dependence
ASJC Scopus subject areas
- Bioengineering
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics
- Mechanical Engineering