Atom probe analysis of a nanocrystalline Fe-C-Ta sputtered soft magnetic thin film

K. Hono, N. Hasegawa, S. S. Babu, H. Fujimori, T. Sakurai

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Sputtered Fe-10.3at%C-8.3at%Ta magnetic thin films annealed below 650°C were analyzed by the atom probe method in order to elucidate the mechanism of formation of the nanocrystalline structure. In the as-deposited amorphous film, evidence for significant variation of the carbon concentration was found. By annealing below the crystallization temperature, the degree of fluctuation of the carbon concentration appeared to be enhanced. After heat treatment for optimum soft magnetic properties, TaC was observed. In this condition, substantial amounts of supersaturated C and Ta were still dissolved in the α-Fe phase.

Original languageEnglish
Pages (from-to)391-397
Number of pages7
JournalApplied Surface Science
Volume67
Issue number1-4
DOIs
Publication statusPublished - 1993 Apr 2
Externally publishedYes

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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