Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

Toshu An; Takahiro Nishio; Toyoaki Eguchi; Masanori Ono; Atsushi Nomura; Kotone Akiyama; Yukio Hasegawa

doi:10.1063/1.2830937

Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

Toshu An, Takahiro Nishio, Toyoaki Eguchi, Masanori Ono, Atsushi Nomura, Kotone Akiyama, Yukio Hasegawa

Research output: Contribution to journal › Article › peer-review

35 Citations (Scopus)

Abstract

Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si (111) - (7×7) surface was successfully obtained.

Original language	English
Article number	033703
Journal	Review of Scientific Instruments
Volume	79
Issue number	3
DOIs	https://doi.org/10.1063/1.2830937
Publication status	Published - 2008
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.2830937

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abstract = "Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si (111) - (7×7) surface was successfully obtained.",

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AU - An, Toshu

AU - Nishio, Takahiro

AU - Eguchi, Toyoaki

AU - Ono, Masanori

AU - Nomura, Atsushi

AU - Akiyama, Kotone

AU - Hasegawa, Yukio

PY - 2008

Y1 - 2008

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AB - Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si (111) - (7×7) surface was successfully obtained.

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Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

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