Atomically resolved local variation of the barrier height of the flip-flop motion of single buckled dimers of Si(100)

K. Hata; Y. Sainoo; H. Shigekawa

doi:10.1103/PhysRevLett.86.3084

Atomically resolved local variation of the barrier height of the flip-flop motion of single buckled dimers of Si(100)

K. Hata, Y. Sainoo, H. Shigekawa

Research output: Contribution to journal › Article › peer-review

79 Citations (Scopus)

Abstract

Single buckled dimers of Si(100) exhibiting flip-flop motions were analyzed. The dynamics were observed by locating the tip of a scanning tunneling microscope over a flip-flopping dimer while measuring the tunneling current. The activation energy as well as the energy splitting between the stable configurations of buckling were both estimated using statistical methods.

Original language	English
Pages (from-to)	3084-3087
Number of pages	4
Journal	Physical review letters
Volume	86
Issue number	14
DOIs	https://doi.org/10.1103/PhysRevLett.86.3084
Publication status	Published - 2001 Apr 2
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1103/PhysRevLett.86.3084

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@article{630c68c40fd04546b2a5a29384341b1c,

title = "Atomically resolved local variation of the barrier height of the flip-flop motion of single buckled dimers of Si(100)",

abstract = "Single buckled dimers of Si(100) exhibiting flip-flop motions were analyzed. The dynamics were observed by locating the tip of a scanning tunneling microscope over a flip-flopping dimer while measuring the tunneling current. The activation energy as well as the energy splitting between the stable configurations of buckling were both estimated using statistical methods.",

author = "K. Hata and Y. Sainoo and H. Shigekawa",

year = "2001",

month = apr,

day = "2",

doi = "10.1103/PhysRevLett.86.3084",

language = "English",

volume = "86",

pages = "3084--3087",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "14",

}

TY - JOUR

T1 - Atomically resolved local variation of the barrier height of the flip-flop motion of single buckled dimers of Si(100)

AU - Hata, K.

AU - Sainoo, Y.

AU - Shigekawa, H.

PY - 2001/4/2

Y1 - 2001/4/2

N2 - Single buckled dimers of Si(100) exhibiting flip-flop motions were analyzed. The dynamics were observed by locating the tip of a scanning tunneling microscope over a flip-flopping dimer while measuring the tunneling current. The activation energy as well as the energy splitting between the stable configurations of buckling were both estimated using statistical methods.

AB - Single buckled dimers of Si(100) exhibiting flip-flop motions were analyzed. The dynamics were observed by locating the tip of a scanning tunneling microscope over a flip-flopping dimer while measuring the tunneling current. The activation energy as well as the energy splitting between the stable configurations of buckling were both estimated using statistical methods.

UR - http://www.scopus.com/inward/record.url?scp=0035794557&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035794557&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.86.3084

DO - 10.1103/PhysRevLett.86.3084

M3 - Article

C2 - 11290113

AN - SCOPUS:0035794557

SN - 0031-9007

VL - 86

SP - 3084

EP - 3087

JO - Physical Review Letters

JF - Physical Review Letters

IS - 14

ER -

Atomically resolved local variation of the barrier height of the flip-flop motion of single buckled dimers of Si(100)

Abstract

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