Atomistic morphology and structure of Si(0 0 1) surface exposed to ethylene at room temperature have been studied by scanning tunneling microscopy (STM) and photoelectron diffraction (PED). At an ethylene coverage (θC) of ∼0.5 monolayer (ML, carbon atom/surface Si-atom), both p(2 × 2) and c(4 × 2) structures were clearly resolved in atomistic STM images. The alignments of chemisorbed ethylene of p(2×2) and c(4 × 2) were confirmed by PED and further shown is that the local structure around chemisorbed ethylene at θC ≅0.5 ML is identical to that at the saturation coverage of 1 ML.
- Photoelectron diffraction
- Scanning tunneling microscopy
- Surface relaxation and reconstruction
- Surface structure, morphology, roughness, and topography