Atomistic morphology and structure of ethylene-chemisorbed Si(0 0 1)2 × 1 surface

M. Shimomura, M. Munakata, A. Iwasaki, M. Ikeda, T. Abukawa, K. Sato, T. Kawawa, H. Shimizu, N. Nagashima, S. Kono

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34 Citations (Scopus)


Atomistic morphology and structure of Si(0 0 1) surface exposed to ethylene at room temperature have been studied by scanning tunneling microscopy (STM) and photoelectron diffraction (PED). At an ethylene coverage (θC) of ∼0.5 monolayer (ML, carbon atom/surface Si-atom), both p(2 × 2) and c(4 × 2) structures were clearly resolved in atomistic STM images. The alignments of chemisorbed ethylene of p(2×2) and c(4 × 2) were confirmed by PED and further shown is that the local structure around chemisorbed ethylene at θC ≅0.5 ML is identical to that at the saturation coverage of 1 ML.

Original languageEnglish
Pages (from-to)19-27
Number of pages9
JournalSurface Science
Publication statusPublished - 2002 Apr 20


  • Alkenes
  • Photoelectron diffraction
  • Scanning tunneling microscopy
  • Silicon
  • Surface relaxation and reconstruction
  • Surface structure, morphology, roughness, and topography


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