@article{378a7917a6d240af9c311463e6d39a2b,
title = "Atomistic morphology and structure of ethylene-chemisorbed Si(0 0 1)2 × 1 surface",
abstract = "Atomistic morphology and structure of Si(0 0 1) surface exposed to ethylene at room temperature have been studied by scanning tunneling microscopy (STM) and photoelectron diffraction (PED). At an ethylene coverage (θC) of ∼0.5 monolayer (ML, carbon atom/surface Si-atom), both p(2 × 2) and c(4 × 2) structures were clearly resolved in atomistic STM images. The alignments of chemisorbed ethylene of p(2×2) and c(4 × 2) were confirmed by PED and further shown is that the local structure around chemisorbed ethylene at θC ≅0.5 ML is identical to that at the saturation coverage of 1 ML.",
keywords = "Alkenes, Photoelectron diffraction, Scanning tunneling microscopy, Silicon, Surface relaxation and reconstruction, Surface structure, morphology, roughness, and topography",
author = "M. Shimomura and M. Munakata and A. Iwasaki and M. Ikeda and T. Abukawa and K. Sato and T. Kawawa and H. Shimizu and N. Nagashima and S. Kono",
note = "Funding Information: The authors gratefully acknowledge Prof. K. Mase for his support at the beamline, Dr. K. Sakamoto and Dr. T. Sakamoto of National Inst. Adv. Industrial Sci. Technol. for the special Si wafers used in this work, and Prof. J. Yoshinobu, for useful discussion. The authors are also grateful to Dr. Y. Chen and Dr. M.A. van Hove for providing the MSCD code of PED simulation. Part of this work is supported by the Grant-in-Aid for Creative Basic Research (09NP1201) and for Scientific Research (A) (2) (#10305005) and Encouragement of Young Scientists (A) (#12750023) of the Ministry of Education, Culture, Sports, Science and Technology of Japan. Experiments at KEK-PF were performed under PF PAC no. 2000G196.",
year = "2002",
month = apr,
day = "20",
doi = "10.1016/S0039-6028(02)01157-3",
language = "English",
volume = "504",
pages = "19--27",
journal = "Surface Science",
issn = "0039-6028",
publisher = "Elsevier",
}