Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF4

E. Shigemasa; T. Hayaishib; K. Okuno; A. Danjo; K. Ueda; Y. Sato; A. Yagishita

doi:10.1016/0368-2048(96)02903-9

Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF₄

E. Shigemasa, T. Hayaishib, K. Okuno, A. Danjo, K. Ueda, Y. Sato, A. Yagishita

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

In order to elucidate state-to-state dissociation dynamics of inner-shell photoexcited molecules, we have investigated ionic fragmentations by energy-resolved Auger-electron-photoion coincidence techniques. Results are presented for the fragmentation of SiF₄ following the Si 2p photoionization. It is found that the fragmentation patterns strongly depend on the Auger final states. The dissociation pathways are discussed on the basis of comparison between the present results and the appearance potential of the ionic species and ion pairs in the literature.

Original language	English
Pages (from-to)	495-498
Number of pages	4
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	79
DOIs	https://doi.org/10.1016/0368-2048(96)02903-9
Publication status	Published - 1996 May
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/0368-2048(96)02903-9

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title = "Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF4",

abstract = "In order to elucidate state-to-state dissociation dynamics of inner-shell photoexcited molecules, we have investigated ionic fragmentations by energy-resolved Auger-electron-photoion coincidence techniques. Results are presented for the fragmentation of SiF4 following the Si 2p photoionization. It is found that the fragmentation patterns strongly depend on the Auger final states. The dissociation pathways are discussed on the basis of comparison between the present results and the appearance potential of the ionic species and ion pairs in the literature.",

author = "E. Shigemasa and T. Hayaishib and K. Okuno and A. Danjo and K. Ueda and Y. Sato and A. Yagishita",

year = "1996",

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doi = "10.1016/0368-2048(96)02903-9",

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pages = "495--498",

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T1 - Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF4

AU - Shigemasa, E.

AU - Hayaishib, T.

AU - Okuno, K.

AU - Danjo, A.

AU - Ueda, K.

AU - Sato, Y.

AU - Yagishita, A.

PY - 1996/5

Y1 - 1996/5

N2 - In order to elucidate state-to-state dissociation dynamics of inner-shell photoexcited molecules, we have investigated ionic fragmentations by energy-resolved Auger-electron-photoion coincidence techniques. Results are presented for the fragmentation of SiF4 following the Si 2p photoionization. It is found that the fragmentation patterns strongly depend on the Auger final states. The dissociation pathways are discussed on the basis of comparison between the present results and the appearance potential of the ionic species and ion pairs in the literature.

AB - In order to elucidate state-to-state dissociation dynamics of inner-shell photoexcited molecules, we have investigated ionic fragmentations by energy-resolved Auger-electron-photoion coincidence techniques. Results are presented for the fragmentation of SiF4 following the Si 2p photoionization. It is found that the fragmentation patterns strongly depend on the Auger final states. The dissociation pathways are discussed on the basis of comparison between the present results and the appearance potential of the ionic species and ion pairs in the literature.

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DO - 10.1016/0368-2048(96)02903-9

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SN - 0368-2048

VL - 79

SP - 495

EP - 498

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

ER -

Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF₄

Abstract

ASJC Scopus subject areas

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