Band structure modulation by carrier doping in random-network carbon nanotube transistors

Shuichi Nakamura, Megumi Ohishi, Masashi Shiraishi, Taishi Takenobu, Yoshihiro Iwasa, Hiromichi Kataura

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

We investigated a role of a Schottky barrier (SB) in carrier doped random-network single-walled carbon nanotube field effect transistors (RN-SWNT-FETs) and the precise estimation of the SB height by a suitable combination of the gate and source-drain voltages. The SB heights were 70 meV for hole and 100 meV for electron in p- and n-type FETs, respectively. Furthermore, the barrier height was able to be modulated by changing the doping level, which indicates the possibility of controlling the characteristics of RN-SWNT-FETs.

Original languageEnglish
Article number013112
JournalApplied Physics Letters
Volume89
Issue number1
DOIs
Publication statusPublished - 2006

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