TY - JOUR
T1 - Bending tolerance of ferroelectric liquid crystal with polymer walls fastening plastic substrates
AU - Sato, Hiroto
AU - Fujikake, Hideo
AU - Kikuchi, Hiroshi
AU - Kurita, Taiichiro
PY - 2003/5/1
Y1 - 2003/5/1
N2 - We studied ferroelectric liquid crystal (LC) deformation in a flexible display device using thin plastic substrates supported by polymer walls. During direct microscope observation of the bent device, no disorder of LC alignment was recognized with LC material flow, which was induced by the thickness change of the LC layer. From the estimated deformation of the bent LC layer (curvature radius: 10 mm) between the extendable substrates, the difference in length between the outer and inner planes of the LC layer was evaluated at only 50 nm, which was extremely small compared with the polymer wall interval (250 μm). The extendable thin substrate is useful for enhancement of the bending tolerance of flexible devices.
AB - We studied ferroelectric liquid crystal (LC) deformation in a flexible display device using thin plastic substrates supported by polymer walls. During direct microscope observation of the bent device, no disorder of LC alignment was recognized with LC material flow, which was induced by the thickness change of the LC layer. From the estimated deformation of the bent LC layer (curvature radius: 10 mm) between the extendable substrates, the difference in length between the outer and inner planes of the LC layer was evaluated at only 50 nm, which was extremely small compared with the polymer wall interval (250 μm). The extendable thin substrate is useful for enhancement of the bending tolerance of flexible devices.
KW - Bending
KW - Extendable substrate
KW - Ferroelectric liquid crystal
KW - Flexible display
KW - Polymer walls
UR - http://www.scopus.com/inward/record.url?scp=0038685289&partnerID=8YFLogxK
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U2 - 10.1143/jjap.42.l476
DO - 10.1143/jjap.42.l476
M3 - Letter
AN - SCOPUS:0038685289
SN - 0021-4922
VL - 42
SP - L476-L478
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 5 A
ER -