TY - JOUR
T1 - Biexciton relaxation associated with dissociation into a surface polariton pair in semiconductor films
AU - Mitsumori, Yasuyoshi
AU - Matsuura, Shimpei
AU - Uchiyama, Shoichi
AU - Saito, Kentarao
AU - Edamatsu, Keiichi
AU - Nakayama, Masaaki
AU - Ajiki, Hiroshi
N1 - Funding Information:
We would like to thank M. Sadgrove of Tohoku University for helpful discussions. We are also grateful to M. Ueda of Osaka City University for his help with the sample preparation. This work was supported by JSPS KAKENHI Grants No. JP16K05403, No. JP15H03678, No. JP22244035, and No. JP24654081.
Funding Information:
We would like to thank M. Sadgrove of Tohoku University for helpful discussions. We are also grateful to M. Ueda of Osaka City University for his help with the sample preparation. This work was supported by JSPS KAKENHI Grants No. JP16K05403, No. JP15H03678, No. JP22244035, and No. JP24654081.
Publisher Copyright:
© 2018 American Physical Society.
PY - 2018/4/12
Y1 - 2018/4/12
N2 - We study the biexciton relaxation process in CuCl films ranging from 6 to 200 nm. The relaxation time is measured as the dephasing time and the lifetime. We observe a unique thickness dependence of the biexciton relaxation time and also obtain an ultrafast relaxation time with a timescale as short as 100 fs, while the exciton lifetime monotonically decreases with increasing thickness. By analyzing the exciton-photon coupling energy for a surface polariton, we theoretically calculate the biexciton relaxation time as a function of the thickness. The calculated dependence qualitatively reproduces the observed relaxation time, indicating that the biexciton dissociation into a surface polariton pair is one of the major biexciton relaxation processes.
AB - We study the biexciton relaxation process in CuCl films ranging from 6 to 200 nm. The relaxation time is measured as the dephasing time and the lifetime. We observe a unique thickness dependence of the biexciton relaxation time and also obtain an ultrafast relaxation time with a timescale as short as 100 fs, while the exciton lifetime monotonically decreases with increasing thickness. By analyzing the exciton-photon coupling energy for a surface polariton, we theoretically calculate the biexciton relaxation time as a function of the thickness. The calculated dependence qualitatively reproduces the observed relaxation time, indicating that the biexciton dissociation into a surface polariton pair is one of the major biexciton relaxation processes.
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U2 - 10.1103/PhysRevB.97.155303
DO - 10.1103/PhysRevB.97.155303
M3 - Article
AN - SCOPUS:85045453527
SN - 2469-9950
VL - 97
JO - Physical Review B
JF - Physical Review B
IS - 15
M1 - 155303
ER -