TY - GEN
T1 - Calibration process for the Young's modulus of a mechanically trapped microbead measured by atomic force microscopy
AU - Chang, Di
AU - Hirate, Takahiro
AU - Uehara, Chihiro
AU - Uozumi, Nobuyuki
AU - Arai, Fumihito
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/12/1
Y1 - 2019/12/1
N2 - This paper reports the measurement of the mechanical property of a trapped microbead using atomic force microscopy (AFM). The influence of the AFM sample immobilization method, which is called mechanical trapping method, is calibrated according to simulation software and force analysis. The calibration accuracy is verified using some PDMS beads.
AB - This paper reports the measurement of the mechanical property of a trapped microbead using atomic force microscopy (AFM). The influence of the AFM sample immobilization method, which is called mechanical trapping method, is calibrated according to simulation software and force analysis. The calibration accuracy is verified using some PDMS beads.
UR - http://www.scopus.com/inward/record.url?scp=85097793300&partnerID=8YFLogxK
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U2 - 10.1109/MHS48134.2019.9249340
DO - 10.1109/MHS48134.2019.9249340
M3 - Conference contribution
AN - SCOPUS:85097793300
T3 - MHS 2019 - 30th 2019 International Symposium on Micro-NanoMechatronics and Human Science
BT - MHS 2019 - 30th 2019 International Symposium on Micro-NanoMechatronics and Human Science
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 30th International Symposium on Micro-NanoMechatronics and Human Science, MHS 2019
Y2 - 1 December 2019 through 4 December 2019
ER -