Carrier density control of Bi-2212 whiskers

K. Inomata; T. Kawae; S. J. Kim; K. Nakajima; T. Yamashita; M. Nagao; H. Maeda

doi:10.1016/S0921-4534(02)00663-9

Carrier density control of Bi-2212 whiskers

K. Inomata, T. Kawae, S. J. Kim, K. Nakajima, T. Yamashita, M. Nagao, H. Maeda

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

The superconducting transition temperature (T_c), the junction resistance (R_N) and the critical current density along the c-axis (J_c) of Bi-2212 whiskers with different oxygen content have been measured. T_c showed a systematical change for the c-axis length. Since the change of c-axis length corresponds to the change of oxygen content, it can be considered that this behavior explains the clear change in carrier density on the whisker from overdoped to underdoped region. J_c of intrinsic Josephson junctions fabricated on the whisker exponentially decreases with decreasing the carrier density on whiskers. It indicates that the transport along the c-axis is due to a tunneling process through an insulating barrier.

Original language	English
Pages (from-to)	335-338
Number of pages	4
Journal	Physica C: Superconductivity and its applications
Volume	372-376
Issue number	PART 1
DOIs	https://doi.org/10.1016/S0921-4534(02)00663-9
Publication status	Published - 2002 Aug
Externally published	Yes

Keywords

Bi-2212 whiskers
C-axis length
Carrier density
Critical current density
Intrinsic Josephson junctions
Junction resistance
Oxygen content

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1016/S0921-4534(02)00663-9

Cite this

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title = "Carrier density control of Bi-2212 whiskers",

abstract = "The superconducting transition temperature (Tc), the junction resistance (RN) and the critical current density along the c-axis (Jc) of Bi-2212 whiskers with different oxygen content have been measured. Tc showed a systematical change for the c-axis length. Since the change of c-axis length corresponds to the change of oxygen content, it can be considered that this behavior explains the clear change in carrier density on the whisker from overdoped to underdoped region. Jc of intrinsic Josephson junctions fabricated on the whisker exponentially decreases with decreasing the carrier density on whiskers. It indicates that the transport along the c-axis is due to a tunneling process through an insulating barrier.",

keywords = "Bi-2212 whiskers, C-axis length, Carrier density, Critical current density, Intrinsic Josephson junctions, Junction resistance, Oxygen content",

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T1 - Carrier density control of Bi-2212 whiskers

AU - Inomata, K.

AU - Kawae, T.

AU - Kim, S. J.

AU - Nakajima, K.

AU - Yamashita, T.

AU - Nagao, M.

AU - Maeda, H.

PY - 2002/8

Y1 - 2002/8

N2 - The superconducting transition temperature (Tc), the junction resistance (RN) and the critical current density along the c-axis (Jc) of Bi-2212 whiskers with different oxygen content have been measured. Tc showed a systematical change for the c-axis length. Since the change of c-axis length corresponds to the change of oxygen content, it can be considered that this behavior explains the clear change in carrier density on the whisker from overdoped to underdoped region. Jc of intrinsic Josephson junctions fabricated on the whisker exponentially decreases with decreasing the carrier density on whiskers. It indicates that the transport along the c-axis is due to a tunneling process through an insulating barrier.

AB - The superconducting transition temperature (Tc), the junction resistance (RN) and the critical current density along the c-axis (Jc) of Bi-2212 whiskers with different oxygen content have been measured. Tc showed a systematical change for the c-axis length. Since the change of c-axis length corresponds to the change of oxygen content, it can be considered that this behavior explains the clear change in carrier density on the whisker from overdoped to underdoped region. Jc of intrinsic Josephson junctions fabricated on the whisker exponentially decreases with decreasing the carrier density on whiskers. It indicates that the transport along the c-axis is due to a tunneling process through an insulating barrier.

KW - Bi-2212 whiskers

KW - C-axis length

KW - Carrier density

KW - Critical current density

KW - Intrinsic Josephson junctions

KW - Junction resistance

KW - Oxygen content

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IS - PART 1

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Carrier density control of Bi-2212 whiskers

Abstract

Keywords

ASJC Scopus subject areas

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