Characterization and modeling of microstrip transmission lines with slow-wave effect

T. Masuda, N. Shiramizu, T. Nakamura, K. Washio

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

We propose a modeling methodology to determine the optimum dimensions of slots in ground shield metal of slow-wave transmission lines. We induce a mutual inductance between a signal conductor and return ground current paths to express an equivalent inductance of the transmission line. The model's accuracy is confirmed by characterization of a fabricated transmission line TEG.

Original languageEnglish
Title of host publication2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Digest of Papers, SiRF
Pages155-158
Number of pages4
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF - Orlando, FL, United States
Duration: 2008 Jan 232008 Jan 25

Publication series

Name2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systms - Digest of Papers, SiRF

Other

Other2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF
Country/TerritoryUnited States
CityOrlando, FL
Period08/1/2308/1/25

Keywords

  • Microstrip transmission line
  • Slow-wave effect

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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