Abstract
The characteristics of bit patterned media with an areal density of 2 Tbit/in 2 were investigated using micromagnetic simulations. The influence of dot size and position dispersions on the signal-to-noise ratio (SNR) was clarified. The head-medium synchronization tolerance (write margin) for error-free writing was calculated, and the feasibility of achieving 2 Tbit/in 2 recording with bit patterned media was demonstrated.
Original language | English |
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Pages (from-to) | 3434-3437 |
Number of pages | 4 |
Journal | IEEE Transactions on Magnetics |
Volume | 44 |
Issue number | 11 PART 2 |
DOIs | |
Publication status | Published - 2008 Nov |
Keywords
- Bit patterned perpendicular media
- Heads
- Magnetic recording
- Simulation