Charge transfer of C60 on copper surfaces

Craig Tindall, Osamu Takaoka, Tsutomu Kobayashi, Yukio Hasegawa, Toshio Sakurai

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


Using Scanning Tunneling Microscopy (STM) to monitor the surface morphology, and High Resolution Electron Energy Loss Spectroscopy (HREELS) to measure the vibrational spectrum, we have systematically investigated the relationship between the surface morphology and charge transfer from Cu(111) and Cu(110) to C60. Since at 300K, C60 is mobile on the Cu(111) terrace, but is more strongly bound at the step edge, any C60 which adsorbs on the terrace will migrate to the step edge where it is immobilized. Because of this, at very low coverages, the C60 preferentially adsorbs at the step edge. The amount of charge transfer from the substrate to the C60 can be determined by measuring the amount of shift of the T1u (IR active) modes. For C60 adsorbed on the terrace, we determined a transfer of approximately 1.6 electrons/C60 molecule. No additional frequency shift of the vibrational modes was seen for C60 adsorbed at the step edge, indicating that any additional charge transfer at the step edge is small - less than one electron/C60 molecule. In contrast, on Cu(110) C60 is not mobile on the terrace, but forms well ordered islands upon annealing. C60 molecules with three different levels of brightness were observed in the STM images, indicating that C60 with different charge states were present on the surface. The HREELS spectrum confirmed this since the single peak observed at 66 meV in the multilayer film split into one shifted and one unshifted component upon annealing to remove the multilayer.

Original languageEnglish
Pages (from-to)51-54
Number of pages4
JournalScience Reports of the Rerearch Institutes Tohoku University Series A-Physics
Issue number1
Publication statusPublished - 1997
Externally publishedYes


  • Charge transfer
  • Copper surfaces
  • Electron energy loss spectroscopy
  • Fullerene molecules
  • Scanning tunneling microscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Metals and Alloys


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