Checker-pattern and shared two pixels LOFIC CMOS image sensors

Yoshiaki Tashiro; Shun Kawada; Shin Sakai; Shigetoshi Sugawa

doi:10.1109/ASPDAC.2010.5419872

Checker-pattern and shared two pixels LOFIC CMOS image sensors

Yoshiaki Tashiro, Shun Kawada, Shin Sakai, Shigetoshi Sugawa

New Industry Creation Hatchery Center (NICHe)

Tohoku University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Two wide dynamic range CMOS image sensors with lateral overflow integration capacitor have been developed. A checker-pattern image sensor has achieved high area efficiency by placing the color filters and on-chip microlens along the direction at an angle of 45°. A shared two pixels image sensor has achieved small pixel pitch by introducing a lateral overflow gate in each pixel. The fabricated image sensors exhibit high full well capacity, low noise, wide dynamic range and high resolution performance.

Original language	English
Title of host publication	2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
Pages	343-344
Number of pages	2
DOIs	https://doi.org/10.1109/ASPDAC.2010.5419872
Publication status	Published - 2010
Event	2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 - Taipei, Taiwan, Province of China Duration: 2010 Jan 18 → 2010 Jan 21

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference	2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
Country/Territory	Taiwan, Province of China
City	Taipei
Period	10/1/18 → 10/1/21

Access to Document

10.1109/ASPDAC.2010.5419872

Cite this

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title = "Checker-pattern and shared two pixels LOFIC CMOS image sensors",

abstract = "Two wide dynamic range CMOS image sensors with lateral overflow integration capacitor have been developed. A checker-pattern image sensor has achieved high area efficiency by placing the color filters and on-chip microlens along the direction at an angle of 45°. A shared two pixels image sensor has achieved small pixel pitch by introducing a lateral overflow gate in each pixel. The fabricated image sensors exhibit high full well capacity, low noise, wide dynamic range and high resolution performance.",

author = "Yoshiaki Tashiro and Shun Kawada and Shin Sakai and Shigetoshi Sugawa",

year = "2010",

doi = "10.1109/ASPDAC.2010.5419872",

language = "English",

isbn = "9781424457656",

series = "Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC",

pages = "343--344",

booktitle = "2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010",

note = "2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 ; Conference date: 18-01-2010 Through 21-01-2010",

}

Tashiro, Y, Kawada, S, Sakai, S & Sugawa, S 2010, Checker-pattern and shared two pixels LOFIC CMOS image sensors. in 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010., 5419872, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, pp. 343-344, 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010, Taipei, Taiwan, Province of China, 10/1/18. https://doi.org/10.1109/ASPDAC.2010.5419872

Checker-pattern and shared two pixels LOFIC CMOS image sensors. / Tashiro, Yoshiaki; Kawada, Shun; Sakai, Shin et al.
2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010. 2010. p. 343-344 5419872 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

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AU - Kawada, Shun

AU - Sakai, Shin

AU - Sugawa, Shigetoshi

PY - 2010

Y1 - 2010

N2 - Two wide dynamic range CMOS image sensors with lateral overflow integration capacitor have been developed. A checker-pattern image sensor has achieved high area efficiency by placing the color filters and on-chip microlens along the direction at an angle of 45°. A shared two pixels image sensor has achieved small pixel pitch by introducing a lateral overflow gate in each pixel. The fabricated image sensors exhibit high full well capacity, low noise, wide dynamic range and high resolution performance.

AB - Two wide dynamic range CMOS image sensors with lateral overflow integration capacitor have been developed. A checker-pattern image sensor has achieved high area efficiency by placing the color filters and on-chip microlens along the direction at an angle of 45°. A shared two pixels image sensor has achieved small pixel pitch by introducing a lateral overflow gate in each pixel. The fabricated image sensors exhibit high full well capacity, low noise, wide dynamic range and high resolution performance.

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DO - 10.1109/ASPDAC.2010.5419872

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T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

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BT - 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010

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Y2 - 18 January 2010 through 21 January 2010

ER -

Checker-pattern and shared two pixels LOFIC CMOS image sensors

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