TY - GEN
T1 - Chemical mechanical polishing mechanisms for gallium nitride
T2 - 11th International Conference on Planarization/CMP Technology, ICPT 2014
AU - Kawaguchi, Kentaro
AU - Aizawa, Takehiro
AU - Higuchi, Yuji
AU - Ozawa, Nobuki
AU - Kubo, Momoji
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2015/1/20
Y1 - 2015/1/20
N2 - We developed a chemical mechanical polishing (CMP) simulator based on tight-binding quantum chemical molecular dynamics method and applied it to gallium nitride (GaN) CMP process. We successfully clarified the chemical reaction dynamics at the friction interface between the GaN substrate and an abrasive grain in pure water; surface-adsorbed H2O molecules, OH groups, and H atoms are generated by the adsorption and dissociation of water on the GaN surface. Our developed CMP simulator is capable of predicting the CMP processes controlled by chemical reactions.
AB - We developed a chemical mechanical polishing (CMP) simulator based on tight-binding quantum chemical molecular dynamics method and applied it to gallium nitride (GaN) CMP process. We successfully clarified the chemical reaction dynamics at the friction interface between the GaN substrate and an abrasive grain in pure water; surface-adsorbed H2O molecules, OH groups, and H atoms are generated by the adsorption and dissociation of water on the GaN surface. Our developed CMP simulator is capable of predicting the CMP processes controlled by chemical reactions.
UR - http://www.scopus.com/inward/record.url?scp=84925377602&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84925377602&partnerID=8YFLogxK
U2 - 10.1109/ICPT.2014.7017241
DO - 10.1109/ICPT.2014.7017241
M3 - Conference contribution
AN - SCOPUS:84925377602
T3 - ICPT 2014 - Proceedings of International Conference on Planarization/CMP Technology 2014
SP - 39
EP - 41
BT - ICPT 2014 - Proceedings of International Conference on Planarization/CMP Technology 2014
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 19 November 2014 through 21 November 2014
ER -